Epi-ready CMP-polished Yttria-Stabilized zirconia (YSZ) Single-Crystal substrates (ZrO2:Y2O3 (8–9.5 mol% Y2O3), CAS 1314-23-4) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.
Precision-grown and chemical-mechanical-polished (CMP) in a Class 100 cleanroom, our Yttria-Stabilized zirconia (YSZ) Single-Crystal substrates (ZrO2:Y2O3 (8–9.5 mol% Y2O3), CAS 1314-23-4) substrates provide atomically smooth, epi-ready surfaces (Ra < 0.2–0.5 nm) for thin-film epitaxy, pulsed laser deposition (PLD), magnetron sputtering, molecular beam epitaxy (MBE), and optical characterization.
Cubic single-crystal YSZ provides chemical inertness, oxygen-ion conductivity at elevated temperatures, and an excellent lattice/thermal buffer for silicon-on-insulator, YBCO, and solid-state electrolyte thin-film studies. Standard research sizes include 5×5 mm, 10×10 mm, and 15×15 mm diced squares (0.5 mm or 1.0 mm thick) as well as Ø 1-inch, 2-inch, 3-inch, and 4-inch wafers in single-side (SSP) or double-side (DSP) polished finishes, packed in individual waffle trays or nitrogen-sealed cassettes with batch orientation and surface inspection data.
| Property / Metric | Nominal Reference Value (Grade Dependent) |
|---|---|
| Formula & CAS # | ZrO2:Y2O3 (8–9.5 mol% Y2O3) (CAS 1314-23-4) |
| Crystal System / Grade | Cubic Fluorite (a = 5.125 Å) · Skull-Melted Cubic Single Crystal 4N |
| Density | 5.90 g/cm³ |
| Standard Orientations | <100>, <110>, <111> |
| Surface Finish (CMP) | Ra < 0.3 nm Epi-Ready CMP (SSP / DSP) |
Reference values reflect typical sintered, fused, or wrought grades. Exact batch test figures are confirmed on your written quotation and accompanying lot Certificate of Analysis.
Specify ZrO2:Y2O3 (8–9.5 mol% Y2O3) crystallographic orientation (<100>, <110>, <111>), dimensions and thickness (e.g., 10×10×0.5 mm or Ø 2" × 0.5 mm), SSP vs. DSP polish, edge orientation, and pack count.
Include target quantity, destination country/postal code for express air freight calculation, and any special cleanroom bagging or certification requests.
Prepare Yttria-Stabilized Zirconia (YSZ) Single-Crystal Substrates RFQ ↗Complementary furnaceware, substrates, PVD consumables, and refractory hardware frequently ordered together.
TB-PVD-ZRO2High-density hot-pressed zirconium dioxide & YSZ (ZrO2 / 8 mol% Y2O3-ZrO2, CAS 1314-23-4) ceramic sputtering targets in 4N (99.99%) purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.
TB-ZRO2-CRTransformation-toughened 3Y-TZP structural zirconia parts and ultra-refractory YSZ/Mg-PSZ crucibles, setter plates, and tubes rated up to 2,100 °C.
TB-SUB-MGOEpi-ready CMP-polished magnesium oxide (MgO) Single-Crystal substrates (MgO, CAS 1309-48-4) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.
TB-SUB-STOEpi-ready CMP-polished strontium titanate (SrTiO3 & Nb:STO) Single-Crystal substrates (SrTiO3 / Nb:SrTiO3, CAS 12060-59-2) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.
Submit your purity grade, geometry, quantity, and documentation requirements. Every order includes the producing mill's batch Certificate of Analysis (COA) and pre-shipment dimensional verification.