Engineered Materials & Labware • Lot COA Included154 Product Lines · CAS & Formula Index · AI / Agent Ready
Engineered Materials & Custom Components

High-purity materials.
Exact specifications.
Lot COA included.

Source technical ceramics, 99.99% fused quartz, single-crystal substrates, isostatic graphite, PVD sputtering targets, evaporation pellets, refractory metals, and battery labware—indexed by chemical formula, CAS number, and engineering tolerance.

154 SKUs6 specialized disciplines
2N – 6NPurity & custom CNC drawing
Lot COABatch chemical & dimensional docs
Assortment of high-purity alumina ceramics, fused quartz wafer carrier, sapphire window, CNC graphite fixture, titanium sputtering target, copper pellets, and molybdenum boat
AL2O3 · H-BN · 4N SIO2 · GRAPHITE · PVD · W / MO / TAR&D TO PRODUCTION
Technical catalog

Search by material, formula, CAS #, or SKU.

Every listing includes nominal physical properties, standard purity tiers, and manufacturer batch COA coverage. Need a custom drawing? Submit an RFQ directly.

By Element:
Showing 154 of 154 technical product lines View compact CAS & Formula Master Table →
Alumina Ceramic Rods (Al2O3, CAS 1344-28-1) — Technical Ceramics studio photographTB-AL2O3-RD
Technical CeramicsAl2O3 · 1344-28-1

Alumina Ceramic Rods

High-stiffness solid sintered alumina rods and centerless-ground shafts for kiln supports, vacuum fixtures, metrological guides, and electrical standoffs.

Purity / Grade99.0% / 99.5% / 99.8% Al2O3
Typical SizeØ 1.0–60 mm × Lengths up to 1,500 mm
Alumina Ceramic Plates (Al2O3, CAS 1344-28-1) — Technical Ceramics studio photographTB-AL2O3-PL
Technical CeramicsAl2O3 · 1344-28-1

Alumina Ceramic Plates

Thin tape-cast electronic substrates (96% / 99.6%) and thick precision-ground alumina setter and wear plates with optional laser cutting or CNC machining.

Purity / Grade96% / 99.5% / 99.6% Al2O3
Typical SizeThickness 0.25–40 mm; up to 400 × 400 mm
Ceramic Insulators (Al2O3 / ZrO2 / MgSiO3, CAS 1344-28-1) — Technical Ceramics studio photographTB-CER-INS
Technical CeramicsAl2O3 / ZrO2 / MgSiO3 · 1344-28-1

Ceramic Insulators

Custom-machined electrical, RF, vacuum, and thermal ceramic bushings, flanged washers, standoffs, and heater bobbins built to your engineering drawing.

Purity / Grade95%–99.8% Al2O3, YSZ, Steatite, Cordierite
Typical SizeCustom CNC / green-machined / dry-pressed to drawing
Hexagonal Boron Nitride (h-BN) Ceramics (BN, CAS 10043-11-5) — Technical Ceramics studio photographTB-HBN-MC
Technical CeramicsBN · 10043-11-5

Hexagonal Boron Nitride (h-BN) Ceramics

Hot-pressed hexagonal boron nitride (h-BN) crucibles, rods, plates, and precision CNC components combining extreme thermal shock resistance, molten-metal non-wetting, and electrical insulation.

Purity / Grade99% Pure BN / Binderless PBN /BN-ZrO2-SiC Composites
Typical SizeCrucibles, rods Ø 6–150 mm, plates, & CNC parts
High-Purity Fused Quartz Furnace Tubes (SiO2, CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-TU
Fused Quartz & SubstratesSiO2 · 60676-86-0

High-Purity Fused Quartz Furnace Tubes

Optically clear 99.99% (4N) fused quartz process tubes for CVD graphene/2D growth, semiconductor diffusion, photochemistry, and rapid-quench tube furnaces up to 1,150 °C.

Purity / Grade≥99.99% SiO2 (4N Semiconductor Grade, <20 ppm total metals)
Typical SizeOD 6–300 mm × Wall 1.5–8 mm × Length up to 2,000 mm
UV Fused Silica & Optical Quartz Windows (SiO2, CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-WN
Fused Quartz & SubstratesSiO2 · 60676-86-0

UV Fused Silica & Optical Quartz Windows

Precision double-side optically polished UV synthetic fused silica (JGS1), optical quartz (JGS2), and full-spectrum IR fused silica (JGS3) windows and wafer substrates.

Purity / GradeJGS1 (Deep-UV 185–2,100 nm) / JGS2 (UV-VIS) / JGS3 (IR Low-OH)
Typical SizeØ 5–200 mm or Square 5×5 to 150×150 mm × Thickness 0.2–20 mm
Single-Crystal Sapphire Windows & Substrates (α-Al2O3 (Single Crystal), CAS 1344-28-1) — Fused Quartz & Substrates studio photographTB-SAP-SB
Fused Quartz & Substratesα-Al2O3 (Single Crystal) · 1344-28-1

Single-Crystal Sapphire Windows & Substrates

Epi-ready single-crystal sapphire substrates (C-, R-, A-, M-plane) and Mohs-9 optical sapphire pressure/IR windows from 180 nm UV to 5.0 µm mid-IR.

Purity / Grade≥99.995% Single-Crystal Al2O3 (4N5–5N Kyropoulos/EFG)
Typical SizeChips 5×5, 10×10 mm; Windows Ø 5–100 mm; Wafers 2", 4", 6"
Graphite Crucibles (C, CAS 7782-42-5) — Graphite Components studio photographTB-GR-CR
Graphite ComponentsC · 7782-42-5

Graphite Crucibles

Precision CNC-turned fine-grain isostatic graphite crucibles with low ash content (<20–500 ppm) for non-ferrous, precious metal, alloy, and crystal-growth melting.

Purity / Grade99.9% (Ash <500 ppm) to 99.995% Purified (<20–50 ppm Ash)
Typical Size5 mL lab cups to 50 kg induction melting crucibles
Custom Graphite Components (C, CAS 7782-42-5) — Graphite Components studio photographTB-GR-CNC
Graphite ComponentsC · 7782-42-5

Custom Graphite Components

Precision CNC-machined isostatic graphite vacuum-furnace heaters, susceptors, brazing fixtures, wafer carriers, and graphite nuts/bolts made to customer CAD drawings.

Purity / GradeIsostatic Grades (1.80–1.92 g/cm³); Purified <5–50 ppm Ash; SiC-Coated
Typical Size5-axis CNC machined from Ø 5 mm pins up to 800 mm furnace rings
Graphite Plates & Blocks (C, CAS 7782-42-5) — Graphite Components studio photographTB-GR-PL
Graphite ComponentsC · 7782-42-5

Graphite Plates & Blocks

Precision ground fine-grain and isostatic graphite sheets, setter plates, EDM blocks, rods, and impermeable resin-impregnated bipolar plates.

Purity / GradeMolded Fine-Grain & Isostatic High-Density (99.9%–99.99% C)
Typical SizePlates 1–100 mm thick; Blocks & Rods cut and surface-ground to size
Pyrolytic Graphite & Glassy (Vitreous) Carbon (C, CAS 7440-44-0) — Graphite Components studio photographTB-PG-GC
Graphite ComponentsC · 7440-44-0

Pyrolytic Graphite & Glassy (Vitreous) Carbon

Ultra-pure 5N CVD pyrolytic graphite (anisotropic thermal/diamagnetic plates) and mirror-polished gas-impermeable glassy (vitreous) carbon electrodes, wafers, and crucibles.

Purity / Grade≥99.999% (5N CVD Pyrolytic Graphite & Polymeric Glassy Carbon)
Typical SizePG plates 0.5–12 mm; Glassy carbon rods, plates, wafers, & crucibles
Metal Sputtering Targets (Ti / Cr / Al / Cu / Ni / W / Mo / Ta, CAS 7440-32-6) — Thin Film Materials studio photographTB-PVD-MT
Thin Film MaterialsTi / Cr / Al / Cu / Ni / W / Mo / Ta · 7440-32-6

Metal Sputtering Targets

Vacuum-melted and thermomechanically forged pure metal and custom alloy planar sputtering targets (3N5–5N) sized for research and production magnetron cathodes.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5 / 5N (99.999%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 1–12.7 mm; Rectangular plates
Oxide & Nitride Ceramic Sputtering Targets (ITO / ZnO / Al2O3 / SiO2 / TiO2 / AlN / SiC, CAS 50926-11-9) — Thin Film Materials studio photographTB-PVD-OX
Thin Film MaterialsITO / ZnO / Al2O3 / SiO2 / TiO2 / AlN / SiC · 50926-11-9

Oxide & Nitride Ceramic Sputtering Targets

High-density hot-pressed and HIP-consolidated oxide, nitride, carbide, and sulfide ceramic sputtering targets (ITO, AZO, ZnO, Al2O3, SiO2, TiO2, BaTiO3) indium-bonded for arc-free RF/pulsed-DC PVD.

Purity / Grade99.9% (3N) / 99.99% (4N) / 99.995% (4N5)
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6 mm (+ Cu Backing Plate)
Evaporation Materials (Al / Cu / Ti / Cr / Ni / Ge / SiO2 / MgF2 / TiO2, CAS 7429-90-5) — Thin Film Materials studio photographTB-PVD-EV
Thin Film MaterialsAl / Cu / Ti / Cr / Ni / Ge / SiO2 / MgF2 / TiO2 · 7429-90-5

Evaporation Materials

Vacuum-degassed 4N–5N metal evaporation slugs/shots and optical dielectric granules (SiO2, Ti3O5, MgF2, Al2O3) engineered for spit-free e-beam and thermal PVD.

Purity / Grade4N (99.99%) / 4N5 / 5N (99.999%) Vacuum-Degassed
Typical Size1–3 mm & 3–6 mm granules/shots, Ø 3×3 or 6×6 mm pellets, starter sources
E-Beam Evaporation Crucible Pocket Liners (Cu / C (Graphite & Vitreous) / Mo / W / Al2O3 / BN, CAS 7440-50-8) — Thin Film Materials studio photographTB-PVD-LN
Thin Film MaterialsCu / C (Graphite & Vitreous) / Mo / W / Al2O3 / BN · 7440-50-8

E-Beam Evaporation Crucible Pocket Liners

Precision-tapered e-beam gun hearth liners in OFHC copper, purified & impermeable graphite, vitreous carbon, molybdenum, tungsten, alumina, and h-BN.

Purity / GradeOFHC Cu (99.99%), Purified Graphite/Vitreous C (<20 ppm), 99.95% Mo/W
Typical Size2 cc, 4 cc, 7 cc, 8 cc, 15 cc, 25 cc, 30 cc, 40 cc, & 100 cc
QCM Thin-Film Deposition Monitor Crystals (α-SiO2 + Au / Ag-Al Alloy Electrodes, CAS 14808-60-7) — Thin Film Materials studio photographTB-PVD-QCM
Thin Film Materialsα-SiO2 + Au / Ag-Al Alloy Electrodes · 14808-60-7

QCM Thin-Film Deposition Monitor Crystals

Precision 6.0 MHz and 5.0 MHz AT-cut plano-convex quartz crystal microbalance (QCM) thickness monitor sensors with gold or stress-relieving alloy electrodes in cleanroom dispenser packs.

Purity / GradeAT-Cut Piezoelectric Quartz (6.0 MHz & 5.0 MHz Fundamental)
Typical SizeØ 13.97 mm (0.550") Plano-Convex Standard Sensor Discs
Tantalum & Niobium Foils, Sheets, Rods & Crucibles (Ta / Nb, CAS 7440-25-7) — Refractory Metals studio photographTB-TA-NB
Refractory MetalsTa / Nb · 7440-25-7

Tantalum & Niobium Foils, Sheets, Rods & Crucibles

Ductile 99.95%–99.99% electron-beam melted tantalum and niobium foils, plates, rods, tubes, and deep-drawn crucibles combining glass-like acid immunity with 3,017 °C refractory performance.

Purity / Grade≥99.95% (3N5) & ≥99.99% (4N) Metallurgical & Capacitor/E-Beam Grades
Typical SizeFoils 0.01–0.5 mm, Plates 1–12 mm, Seamless Tubes, Rods, Deep-Drawn Crucibles
Porous Nickel & Copper Metal Foam Current Collectors (Ni / Cu / Fe-Ni / Ni-Cr, CAS 7440-02-0) — Battery & Milling Labware studio photographTB-BAT-FM
Battery & Milling LabwareNi / Cu / Fe-Ni / Ni-Cr · 7440-02-0

Porous Nickel & Copper Metal Foam Current Collectors

High-porosity (95%–98%) 3D reticulated open-cell nickel, copper, and Fe-Ni metal foams in lab sheets, rolls, and pre-punched coin-cell discs for battery, supercapacitor, and electrocatalysis R&D.

Purity / Grade≥99.8% Ni & ≥99.9% Cu Open-Cell 3D Reticulated Metal Foams
Typical SizeThickness 0.3–10 mm; Sheets 100×100, 200×300 mm, Continuous Rolls, Punched Discs
Sintered Titanium Fiber Felt & Porous Transport Layers (Ti (Optional Pt / IrO2 Coating), CAS 7440-32-6) — Battery & Milling Labware studio photographTB-EC-TIF
Battery & Milling LabwareTi (Optional Pt / IrO2 Coating) · 7440-32-6

Sintered Titanium Fiber Felt & Porous Transport Layers

Vacuum-sintered pure titanium microfiber felt (0.2–1.0 mm) and platinized Ti porous transport layers (PTLs) engineered for PEM water electrolyzers, regenerative fuel cells, and corrosive filtration.

Purity / Grade≥99.7% Vacuum-Sintered Pure Titanium Microfibers
Typical SizeThickness 0.20, 0.25, 0.30, 0.40, 0.50, 0.80, 1.0 mm; Porosity 50%–78%
Yttria-Stabilized Zirconia Grinding Media & Mill Jars (ZrO2 · Y2O3 (95% 3Y-TZP), CAS 1314-23-4) — Battery & Milling Labware studio photographTB-MIL-ZR
Battery & Milling LabwareZrO2 · Y2O3 (95% 3Y-TZP) · 1314-23-4

Yttria-Stabilized Zirconia Grinding Media & Mill Jars

High-density (6.0 g/cm³), mirror-polished 95% yttria-stabilized zirconia (3Y-TZP) grinding balls/beads and planetary ball-mill jars for ultra-low-wear, iron-free sub-micron milling.

Purity / Grade94.7%–95% ZrO2 + 5.2 wt% Y2O3 (3 mol% YSZ Ultra-Low-Wear Grade)
Typical SizeBeads/Balls Ø 0.1 mm to 30 mm; Planetary Jars 50 mL to 1,000 mL
PTFE & PPL Hydrothermal Synthesis Autoclave Reactors (PTFE / PPL + 316L Stainless Steel, CAS 9002-84-0) — Battery & Milling Labware studio photographTB-LAB-HYD
Battery & Milling LabwarePTFE / PPL + 316L Stainless Steel · 9002-84-0

PTFE & PPL Hydrothermal Synthesis Autoclave Reactors

316L stainless-steel hydrothermal and solvothermal synthesis autoclave reactors with removable virgin PTFE (up to 220 °C) or high-temperature PPL (up to 280 °C) inert liners.

Purity / GradeVirgin Trace-Metal-Clean PTFE (≤220 °C) & PPL Para-Polyphenylene (≤260–280 °C)
Typical Size10, 25, 50, 100, 150, 200, 250, & 500 mL Chamber Volumes
Titanium (Ti) Sputtering Targets (Ti, CAS 7440-32-6) — Thin Film Materials studio photographTB-PVD-TI
Thin Film MaterialsTi · 7440-32-6

Titanium (Ti) Sputtering Targets

Vacuum-melted high-purity titanium (Ti, CAS 7440-32-6) planar magnetron sputtering targets in 4N (99.99%) / 4N5 (99.995%) / 5N grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 (99.995%) / 5N
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Chromium (Cr) Sputtering Targets (Cr, CAS 7440-47-3) — Thin Film Materials studio photographTB-PVD-CR
Thin Film MaterialsCr · 7440-47-3

Chromium (Cr) Sputtering Targets

Vacuum-melted high-purity chromium (Cr, CAS 7440-47-3) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) / 4N5 grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Aluminum (Al) Sputtering Targets (Al, CAS 7429-90-5) — Thin Film Materials studio photographTB-PVD-AL
Thin Film MaterialsAl · 7429-90-5

Aluminum (Al) Sputtering Targets

Vacuum-melted high-purity aluminum (Al, CAS 7429-90-5) planar magnetron sputtering targets in 4N (99.99%) / 5N (99.999%) / 5N5 grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 5N (99.999%) / 5N5
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Copper (Cu) Sputtering Targets (Cu, CAS 7440-50-8) — Thin Film Materials studio photographTB-PVD-CU
Thin Film MaterialsCu · 7440-50-8

Copper (Cu) Sputtering Targets

Vacuum-melted high-purity copper (Cu, CAS 7440-50-8) planar magnetron sputtering targets in 4N5 (99.995%) / 5N (99.999%) / 6N OFHC grades for semiconductor, optical, and research PVD.

Purity / Grade4N5 (99.995%) / 5N (99.999%) / 6N OFHC
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Nickel (Ni) Sputtering Targets (Ni, CAS 7440-02-0) — Thin Film Materials studio photographTB-PVD-NI
Thin Film MaterialsNi · 7440-02-0

Nickel (Ni) Sputtering Targets

Vacuum-melted high-purity nickel (Ni, CAS 7440-02-0) planar magnetron sputtering targets in 4N (99.99%) / 4N5 (99.995%) / 5N grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 (99.995%) / 5N
Typical SizeØ 1", 2", 3", 4" × 1.0–2.0 mm (thin magnetic pass-through) or 3–6 mm
Tungsten (W) Sputtering Targets (W, CAS 7440-33-7) — Thin Film Materials studio photographTB-PVD-W
Thin Film MaterialsW · 7440-33-7

Tungsten (W) Sputtering Targets

Vacuum-melted high-purity tungsten (W, CAS 7440-33-7) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) / 5N grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 5N
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Molybdenum (Mo) Sputtering Targets (Mo, CAS 7439-98-7) — Thin Film Materials studio photographTB-PVD-MO
Thin Film MaterialsMo · 7439-98-7

Molybdenum (Mo) Sputtering Targets

Vacuum-melted high-purity molybdenum (Mo, CAS 7439-98-7) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) / 4N5 grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Tantalum (Ta) Sputtering Targets (Ta, CAS 7440-25-7) — Thin Film Materials studio photographTB-PVD-TA
Thin Film MaterialsTa · 7440-25-7

Tantalum (Ta) Sputtering Targets

Vacuum-melted high-purity tantalum (Ta, CAS 7440-25-7) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) / 4N5 grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Niobium (Nb) Sputtering Targets (Nb, CAS 7440-03-1) — Thin Film Materials studio photographTB-PVD-NB
Thin Film MaterialsNb · 7440-03-1

Niobium (Nb) Sputtering Targets

Vacuum-melted high-purity niobium (Nb, CAS 7440-03-1) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) / High-RRR 4N5 grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / High-RRR 4N5
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Silicon (Si) Sputtering Targets (Si, CAS 7440-21-3) — Thin Film Materials studio photographTB-PVD-SI
Thin Film MaterialsSi · 7440-21-3

Silicon (Si) Sputtering Targets

Vacuum-melted high-purity silicon (Si, CAS 7440-21-3) planar magnetron sputtering targets in 5N (99.999%) / 6N Intrinsic, B-doped (p-type), or P-doped (n-type) grades for semiconductor, optical, and research PVD.

Purity / Grade5N (99.999%) / 6N Intrinsic, B-doped (p-type), or P-doped (n-type)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Germanium (Ge) Sputtering Targets (Ge, CAS 7440-56-4) — Thin Film Materials studio photographTB-PVD-GE
Thin Film MaterialsGe · 7440-56-4

Germanium (Ge) Sputtering Targets

Vacuum-melted high-purity germanium (Ge, CAS 7440-56-4) planar magnetron sputtering targets in 5N (99.999%) / 6N (99.9999%) Intrinsic or Ga/Sb-Doped grades for semiconductor, optical, and research PVD.

Purity / Grade5N (99.999%) / 6N (99.9999%) Intrinsic or Ga/Sb-Doped
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Vanadium (V) Sputtering Targets (V, CAS 7440-62-2) — Thin Film Materials studio photographTB-PVD-V
Thin Film MaterialsV · 7440-62-2

Vanadium (V) Sputtering Targets

Vacuum-melted high-purity vanadium (V, CAS 7440-62-2) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Zirconium (Zr) Sputtering Targets (Zr, CAS 7440-67-7) — Thin Film Materials studio photographTB-PVD-ZR
Thin Film MaterialsZr · 7440-67-7

Zirconium (Zr) Sputtering Targets

Vacuum-melted high-purity zirconium (Zr, CAS 7440-67-7) planar magnetron sputtering targets in 3N5 (99.95% Grade 702) / 4N Low-Hf (<100 ppm Hf) grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95% Grade 702) / 4N Low-Hf (<100 ppm Hf)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Hafnium (Hf) Sputtering Targets (Hf, CAS 7440-58-6) — Thin Film Materials studio photographTB-PVD-HF
Thin Film MaterialsHf · 7440-58-6

Hafnium (Hf) Sputtering Targets

Vacuum-melted high-purity hafnium (Hf, CAS 7440-58-6) planar magnetron sputtering targets in 3N5 (99.95% excl. Zr) / 4N Low-Zr grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95% excl. Zr) / 4N Low-Zr
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Cobalt (Co) Sputtering Targets (Co, CAS 7440-48-4) — Thin Film Materials studio photographTB-PVD-CO
Thin Film MaterialsCo · 7440-48-4

Cobalt (Co) Sputtering Targets

Vacuum-melted high-purity cobalt (Co, CAS 7440-48-4) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) / 4N5 grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5
Typical SizeØ 1", 2", 3", 4" × 1.0–2.0 mm (thin magnetic pass-through) or 3–6 mm
Iron (Fe) Sputtering Targets (Fe, CAS 7439-89-6) — Thin Film Materials studio photographTB-PVD-FE
Thin Film MaterialsFe · 7439-89-6

Iron (Fe) Sputtering Targets

Vacuum-melted high-purity iron (Fe, CAS 7439-89-6) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) / 4N5 grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Manganese (Mn) Sputtering Targets (Mn, CAS 7439-96-5) — Thin Film Materials studio photographTB-PVD-MN
Thin Film MaterialsMn · 7439-96-5

Manganese (Mn) Sputtering Targets

Vacuum-melted high-purity manganese (Mn, CAS 7439-96-5) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99%) grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Zinc (Zn) Sputtering Targets (Zn, CAS 7440-66-6) — Thin Film Materials studio photographTB-PVD-ZN
Thin Film MaterialsZn · 7440-66-6

Zinc (Zn) Sputtering Targets

Vacuum-melted high-purity zinc (Zn, CAS 7440-66-6) planar magnetron sputtering targets in 4N (99.99%) / 4N5 (99.995%) / 5N grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 (99.995%) / 5N
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Tin (Sn) Sputtering Targets (Sn, CAS 7440-31-5) — Thin Film Materials studio photographTB-PVD-SN
Thin Film MaterialsSn · 7440-31-5

Tin (Sn) Sputtering Targets

Vacuum-melted high-purity tin (Sn, CAS 7440-31-5) planar magnetron sputtering targets in 4N (99.99%) / 4N5 / 5N (99.999%) grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 / 5N (99.999%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Indium (In) Sputtering Targets (In, CAS 7440-74-6) — Thin Film Materials studio photographTB-PVD-IN
Thin Film MaterialsIn · 7440-74-6

Indium (In) Sputtering Targets

Vacuum-melted high-purity indium (In, CAS 7440-74-6) planar magnetron sputtering targets in 4N5 (99.995%) / 5N (99.999%) / 6N grades for semiconductor, optical, and research PVD.

Purity / Grade4N5 (99.995%) / 5N (99.999%) / 6N
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Bismuth (Bi) Sputtering Targets (Bi, CAS 7440-69-9) — Thin Film Materials studio photographTB-PVD-BI
Thin Film MaterialsBi · 7440-69-9

Bismuth (Bi) Sputtering Targets

Vacuum-melted high-purity bismuth (Bi, CAS 7440-69-9) planar magnetron sputtering targets in 4N (99.99%) / 4N5 / 5N (99.999%) grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 / 5N (99.999%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Antimony (Sb) Sputtering Targets (Sb, CAS 7440-36-0) — Thin Film Materials studio photographTB-PVD-SB
Thin Film MaterialsSb · 7440-36-0

Antimony (Sb) Sputtering Targets

Vacuum-melted high-purity antimony (Sb, CAS 7440-36-0) planar magnetron sputtering targets in 4N (99.99%) / 4N5 / 5N (99.999%) grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 / 5N (99.999%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Tellurium (Te) Sputtering Targets (Te, CAS 13494-80-9) — Thin Film Materials studio photographTB-PVD-TE
Thin Film MaterialsTe · 13494-80-9

Tellurium (Te) Sputtering Targets

Vacuum-melted high-purity tellurium (Te, CAS 13494-80-9) planar magnetron sputtering targets in 4N (99.99%) / 4N5 / 5N (99.999%) grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 / 5N (99.999%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Yttrium (Y) Sputtering Targets (Y, CAS 7440-65-5) — Thin Film Materials studio photographTB-PVD-Y
Thin Film MaterialsY · 7440-65-5

Yttrium (Y) Sputtering Targets

Vacuum-melted high-purity yttrium (Y, CAS 7440-65-5) planar magnetron sputtering targets in 3N (99.9%) / 3N5 (99.95% REM) grades for semiconductor, optical, and research PVD.

Purity / Grade3N (99.9%) / 3N5 (99.95% REM)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Scandium (Sc) Sputtering Targets (Sc, CAS 7440-20-2) — Thin Film Materials studio photographTB-PVD-SC
Thin Film MaterialsSc · 7440-20-2

Scandium (Sc) Sputtering Targets

Vacuum-melted high-purity scandium (Sc, CAS 7440-20-2) planar magnetron sputtering targets in 3N5 (99.95%) / 4N (99.99% REM) grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N (99.99% REM)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Rare-Earth Metal (La, Ce, Gd, Nd, Er, Yb) (La / Ce / Gd / Nd / Er / Yb) Sputtering Targets (La / Ce / Gd / Nd / Er / Yb, CAS 7439-91-0) — Thin Film Materials studio photographTB-PVD-RE
Thin Film MaterialsLa / Ce / Gd / Nd / Er / Yb · 7439-91-0

Rare-Earth Metal (La, Ce, Gd, Nd, Er, Yb) (La / Ce / Gd / Nd / Er / Yb) Sputtering Targets

Vacuum-melted high-purity Rare-Earth metal (la, ce, gd, nd, er, yb) (La / Ce / Gd / Nd / Er / Yb, CAS 7439-91-0) planar magnetron sputtering targets in 3N (99.9%) / 3N5 (99.95%) / 4N (REM basis) grades for semiconductor, optical, and research PVD.

Purity / Grade3N (99.9%) / 3N5 (99.95%) / 4N (REM basis)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Silver (Ag) Sputtering Targets (Ag, CAS 7440-22-4) — Thin Film Materials studio photographTB-PVD-AG
Thin Film MaterialsAg · 7440-22-4

Silver (Ag) Sputtering Targets

Vacuum-melted high-purity silver (Ag, CAS 7440-22-4) planar magnetron sputtering targets in 4N (99.99%) / 4N5 (99.995%) / 5N grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5 (99.995%) / 5N
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Titanium-Tungsten (TiW 10/90) (TiW (10:90 wt% / 30:70 at.%)) Sputtering Targets (TiW (10:90 wt% / 30:70 at.%), CAS 7440-33-7) — Thin Film Materials studio photographTB-PVD-TIW
Thin Film MaterialsTiW (10:90 wt% / 30:70 at.%) · 7440-33-7

Titanium-Tungsten (TiW 10/90) (TiW (10:90 wt% / 30:70 at.%)) Sputtering Targets

Vacuum-melted high-purity Titanium-Tungsten (TiW 10/90) (TiW (10:90 wt% / 30:70 at.%), CAS 7440-33-7) planar magnetron sputtering targets in 3N5 (99.95%) / 4N Low-Alkali Semiconductor Grade grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N Low-Alkali Semiconductor Grade
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Nickel-Chromium (NiCr 80/20) (NiCr (80:20 / 60:40 / 50:50 wt%)) Sputtering Targets (NiCr (80:20 / 60:40 / 50:50 wt%), CAS 11106-97-1) — Thin Film Materials studio photographTB-PVD-NICR
Thin Film MaterialsNiCr (80:20 / 60:40 / 50:50 wt%) · 11106-97-1

Nickel-Chromium (NiCr 80/20) (NiCr (80:20 / 60:40 / 50:50 wt%)) Sputtering Targets

Vacuum-melted high-purity Nickel-Chromium (NiCr 80/20) (NiCr (80:20 / 60:40 / 50:50 wt%), CAS 11106-97-1) planar magnetron sputtering targets in 3N5 (99.95%) / 4N grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Permalloy (Ni80Fe20 & CoFeB) (Ni80Fe20 / Ni81Fe19 / Co40Fe40B20) Sputtering Targets (Ni80Fe20 / Ni81Fe19 / Co40Fe40B20, CAS 12168-54-6) — Thin Film Materials studio photographTB-PVD-NIFE
Thin Film MaterialsNi80Fe20 / Ni81Fe19 / Co40Fe40B20 · 12168-54-6

Permalloy (Ni80Fe20 & CoFeB) (Ni80Fe20 / Ni81Fe19 / Co40Fe40B20) Sputtering Targets

Vacuum-melted high-purity permalloy (Ni80Fe20 & CoFeB) (Ni80Fe20 / Ni81Fe19 / Co40Fe40B20, CAS 12168-54-6) planar magnetron sputtering targets in 3N5 (99.95%) / 4N Vacuum-Induction Melted grades for semiconductor, optical, and research PVD.

Purity / Grade3N5 (99.95%) / 4N Vacuum-Induction Melted
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Aluminum-Scandium (AlSc Alloy) (Al1-xScx (Sc 5–43 at.%)) Sputtering Targets (Al1-xScx (Sc 5–43 at.%), CAS 60683-64-9) — Thin Film Materials studio photographTB-PVD-ALSC
Thin Film MaterialsAl1-xScx (Sc 5–43 at.%) · 60683-64-9

Aluminum-Scandium (AlSc Alloy) (Al1-xScx (Sc 5–43 at.%)) Sputtering Targets

Vacuum-melted high-purity Aluminum-Scandium (AlSc alloy) (Al1-xScx (Sc 5–43 at.%), CAS 60683-64-9) planar magnetron sputtering targets in 4N (99.99%) Vacuum-Melted / HIP Intermetallic grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) Vacuum-Melted / HIP Intermetallic
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Copper-Gallium & CIGS Alloy (CuGa (70:30 / 75:25) & CuInGaSe2) Sputtering Targets (CuGa (70:30 / 75:25) & CuInGaSe2, CAS 57606-41-4) — Thin Film Materials studio photographTB-PVD-CIGS
Thin Film MaterialsCuGa (70:30 / 75:25) & CuInGaSe2 · 57606-41-4

Copper-Gallium & CIGS Alloy (CuGa (70:30 / 75:25) & CuInGaSe2) Sputtering Targets

Vacuum-melted high-purity Copper-Gallium & CIGS alloy (CuGa (70:30 / 75:25) & CuInGaSe2, CAS 57606-41-4) planar magnetron sputtering targets in 4N (99.99%) / 4N5 grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) / 4N5
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Indium Tin Oxide (In2O3:SnO2 (90:10 wt%)) Sputtering Targets (In2O3:SnO2 (90:10 wt%), CAS 50926-11-9) — Thin Film Materials studio photographTB-PVD-ITO
Thin Film MaterialsIn2O3:SnO2 (90:10 wt%) · 50926-11-9

Indium Tin Oxide (In2O3:SnO2 (90:10 wt%)) Sputtering Targets

High-density hot-pressed indium tin oxide (In2O3:SnO2 (90:10 wt%), CAS 50926-11-9) ceramic sputtering targets in 4N (99.99%) · ≥99.5% Relative Density purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade4N (99.99%) · ≥99.5% Relative Density
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Zinc Oxide (ZnO) Sputtering Targets (ZnO, CAS 1314-13-2) — Thin Film Materials studio photographTB-PVD-ZNO
Thin Film MaterialsZnO · 1314-13-2

Zinc Oxide (ZnO) Sputtering Targets

High-density hot-pressed zinc oxide (ZnO, CAS 1314-13-2) ceramic sputtering targets in 4N (99.99%) / 4N5 / 5N purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade4N (99.99%) / 4N5 / 5N
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Tin Dioxide & Antimony/Fluorine Doped (SnO2 / ATO (SnO2:Sb2O3)) Sputtering Targets (SnO2 / ATO (SnO2:Sb2O3), CAS 18282-10-5) — Thin Film Materials studio photographTB-PVD-SNO2
Thin Film MaterialsSnO2 / ATO (SnO2:Sb2O3) · 18282-10-5

Tin Dioxide & Antimony/Fluorine Doped (SnO2 / ATO (SnO2:Sb2O3)) Sputtering Targets

High-density hot-pressed tin dioxide & Antimony/Fluorine doped (SnO2 / ATO (SnO2:Sb2O3), CAS 18282-10-5) ceramic sputtering targets in 4N (99.99%) purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade4N (99.99%)
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Indium Gallium Zinc Oxide (IGZO) (InGaZnO4 (In:Ga:Zn = 1:1:1 at.%)) Sputtering Targets (InGaZnO4 (In:Ga:Zn = 1:1:1 at.%), CAS Composition dependent; confirm supplier SDS) — Thin Film Materials studio photographTB-PVD-IGZO
Thin Film MaterialsInGaZnO4 (In:Ga:Zn = 1:1:1 at.%) · Composition dependent; confirm supplier SDS

Indium Gallium Zinc Oxide (IGZO) (InGaZnO4 (In:Ga:Zn = 1:1:1 at.%)) Sputtering Targets

High-density hot-pressed indium gallium zinc oxide (IGZO) (InGaZnO4 (In:Ga:Zn = 1:1:1 at.%), CAS Composition dependent; confirm supplier SDS) ceramic sputtering targets in 4N (99.99%) · High-Density Conductive Ceramic purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade4N (99.99%) · High-Density Conductive Ceramic
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Barium Titanate & Barium Strontium Titanate (BaTiO3 / Ba1-xSrxTiO3 (BST)) Sputtering Targets (BaTiO3 / Ba1-xSrxTiO3 (BST), CAS 12047-27-7) — Thin Film Materials studio photographTB-PVD-BST
Thin Film MaterialsBaTiO3 / Ba1-xSrxTiO3 (BST) · 12047-27-7

Barium Titanate & Barium Strontium Titanate (BaTiO3 / Ba1-xSrxTiO3 (BST)) Sputtering Targets

High-density hot-pressed barium titanate & barium strontium titanate (BaTiO3 / Ba1-xSrxTiO3 (BST), CAS 12047-27-7) ceramic sputtering targets in 3N5 (99.95%) / 4N purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade3N5 (99.95%) / 4N
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Lead Zirconate Titanate (PZT 52/48) (Pb(Zr0.52Ti0.48)O3 (+10–20 mol% excess PbO)) Sputtering Targets (Pb(Zr0.52Ti0.48)O3 (+10–20 mol% excess PbO), CAS 12626-81-2) — Thin Film Materials studio photographTB-PVD-PZT
Thin Film MaterialsPb(Zr0.52Ti0.48)O3 (+10–20 mol% excess PbO) · 12626-81-2

Lead Zirconate Titanate (PZT 52/48) (Pb(Zr0.52Ti0.48)O3 (+10–20 mol% excess PbO)) Sputtering Targets

High-density hot-pressed lead zirconate titanate (PZT 52/48) (Pb(Zr0.52Ti0.48)O3 (+10–20 mol% excess PbO), CAS 12626-81-2) ceramic sputtering targets in 3N5 (99.95%) purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade3N5 (99.95%)
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Solid-State Battery Targets (LiCoO2, Li3PO4, LLZO) (LiCoO2 / Li3PO4 / LiMn2O4 / Li4Ti5O12 / LLZO) Sputtering Targets (LiCoO2 / Li3PO4 / LiMn2O4 / Li4Ti5O12 / LLZO, CAS 12190-79-3) — Thin Film Materials studio photographTB-PVD-LIB
Thin Film MaterialsLiCoO2 / Li3PO4 / LiMn2O4 / Li4Ti5O12 / LLZO · 12190-79-3

Solid-State Battery Targets (LiCoO2, Li3PO4, LLZO) (LiCoO2 / Li3PO4 / LiMn2O4 / Li4Ti5O12 / LLZO) Sputtering Targets

High-density hot-pressed Solid-State battery targets (LiCoO2, Li3PO4, LLZO) (LiCoO2 / Li3PO4 / LiMn2O4 / Li4Ti5O12 / LLZO, CAS 12190-79-3) ceramic sputtering targets in 3N5 (99.95%) / 4N (with optional 10–15% Li excess) purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade3N5 (99.95%) / 4N (with optional 10–15% Li excess)
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
2D Transition-Metal Dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2) Sputtering Targets (MoS2 / WS2 / MoSe2 / WSe2, CAS 1317-33-5) — Thin Film Materials studio photographTB-PVD-TMD
Thin Film MaterialsMoS2 / WS2 / MoSe2 / WSe2 · 1317-33-5

2D Transition-Metal Dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2) Sputtering Targets

High-density hot-pressed 2D Transition-Metal dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2, CAS 1317-33-5) ceramic sputtering targets in 4N (99.99%) purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade4N (99.99%)
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Zinc Sulfide & Zinc Selenide (ZnS, ZnSe) (ZnS / ZnSe) Sputtering Targets (ZnS / ZnSe, CAS 1314-98-3) — Thin Film Materials studio photographTB-PVD-ZNS
Thin Film MaterialsZnS / ZnSe · 1314-98-3

Zinc Sulfide & Zinc Selenide (ZnS, ZnSe) (ZnS / ZnSe) Sputtering Targets

High-density hot-pressed zinc sulfide & zinc selenide (ZnS, ZnSe) (ZnS / ZnSe, CAS 1314-98-3) ceramic sputtering targets in 4N5 (99.995%) / 5N CVD Optical Grade purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.

Purity / Grade4N5 (99.995%) / 5N CVD Optical Grade
Typical SizeØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Titanium (Ti) Evaporation Materials (Ti, CAS 7440-32-6) — Thin Film Materials studio photographTB-EV-TI
Thin Film MaterialsTi · 7440-32-6

Titanium (Ti) Evaporation Materials

Vacuum-degassed 4N5 (99.995%) / 5N (99.999%) titanium (Ti, CAS 7440-32-6) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N5 (99.995%) / 5N (99.999%)
Typical SizeØ 3×3 mm & Ø 6×6 mm vacuum-degassed slugs; pre-melted hearth starter cones
Chromium (Cr) Evaporation Materials (Cr, CAS 7440-47-3) — Thin Film Materials studio photographTB-EV-CR
Thin Film MaterialsCr · 7440-47-3

Chromium (Cr) Evaporation Materials

Vacuum-degassed 4N (99.99%) / 4N5 (99.995%) chromium (Cr, CAS 7440-47-3) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N (99.99%) / 4N5 (99.995%)
Typical Size1–3 mm & 2–5 mm degassed chunks/granules; Cr-plated W evaporation rods
Copper (Cu) Evaporation Materials (Cu, CAS 7440-50-8) — Thin Film Materials studio photographTB-EV-CU
Thin Film MaterialsCu · 7440-50-8

Copper (Cu) Evaporation Materials

Vacuum-degassed 5N (99.999%) / 6N OFHC copper (Cu, CAS 7440-50-8) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade5N (99.999%) / 6N OFHC
Typical SizeØ 3×3 mm & Ø 6×6 mm oxygen-free cylindrical slugs; 2–5 mm shot
Nickel (Ni) Evaporation Materials (Ni, CAS 7440-02-0) — Thin Film Materials studio photographTB-EV-NI
Thin Film MaterialsNi · 7440-02-0

Nickel (Ni) Evaporation Materials

Vacuum-degassed 4N5 (99.995%) / 5N (99.999%) nickel (Ni, CAS 7440-02-0) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N5 (99.995%) / 5N (99.999%)
Typical SizeØ 3×3 mm & Ø 6×6 mm vacuum-degassed slugs
Silver (Ag) Evaporation Materials (Ag, CAS 7440-22-4) — Thin Film Materials studio photographTB-EV-AG
Thin Film MaterialsAg · 7440-22-4

Silver (Ag) Evaporation Materials

Vacuum-degassed 4N5 (99.995%) / 5N (99.999%) silver (Ag, CAS 7440-22-4) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N5 (99.995%) / 5N (99.999%)
Typical SizeØ 3×3 mm & Ø 6×6 mm slugs; 1–3 mm vacuum-melted shot
Germanium (Ge) Evaporation Materials (Ge, CAS 7440-56-4) — Thin Film Materials studio photographTB-EV-GE
Thin Film MaterialsGe · 7440-56-4

Germanium (Ge) Evaporation Materials

Vacuum-degassed 5N (99.999%) / 6N Zone-Refined germanium (Ge, CAS 7440-56-4) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade5N (99.999%) / 6N Zone-Refined
Typical Size1–4 mm & 3–6 mm crystalline pieces; pre-melted hearth slugs
Magnesium Fluoride (MgF2) Evaporation Materials (MgF2, CAS 7783-40-6) — Thin Film Materials studio photographTB-EV-MGF2
Thin Film MaterialsMgF2 · 7783-40-6

Magnesium Fluoride (MgF2) Evaporation Materials

Vacuum-degassed 4N5 (99.995%) Vacuum-Grown Crystal Optical Grade magnesium fluoride (MgF2, CAS 7783-40-6) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N5 (99.995%) Vacuum-Grown Crystal Optical Grade
Typical Size1–3 mm & 2–4 mm vacuum-melted crystalline granules
Titanium Sub-Oxide (Ti3O5 & TiO2) (Ti3O5 / TiO2) Evaporation Materials (Ti3O5 / TiO2, CAS 12065-65-5) — Thin Film Materials studio photographTB-EV-TI3O5
Thin Film MaterialsTi3O5 / TiO2 · 12065-65-5

Titanium Sub-Oxide (Ti3O5 & TiO2) (Ti3O5 / TiO2) Evaporation Materials

Vacuum-degassed 4N (99.99%) Pre-Reduced Spit-Free Optical Grade titanium Sub-Oxide (Ti3O5 & TiO2) (Ti3O5 / TiO2, CAS 12065-65-5) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N (99.99%) Pre-Reduced Spit-Free Optical Grade
Typical Size1–3 mm & 2–4 mm black sintered granules; Ø 10–20 mm vacuum-sintered tablets
Hafnium Dioxide (HfO2) Evaporation Materials (HfO2, CAS 12055-23-1) — Thin Film Materials studio photographTB-EV-HFO2
Thin Film MaterialsHfO2 · 12055-23-1

Hafnium Dioxide (HfO2) Evaporation Materials

Vacuum-degassed 4N (99.99% excl. Zr) / 4N5 Low-Zr Laser Grade hafnium dioxide (HfO2, CAS 12055-23-1) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N (99.99% excl. Zr) / 4N5 Low-Zr Laser Grade
Typical Size1–3 mm & 1–4 mm high-density sintered granules and tablets
Zirconium Dioxide (ZrO2) Evaporation Materials (ZrO2, CAS 1314-23-4) — Thin Film Materials studio photographTB-EV-ZRO2
Thin Film MaterialsZrO2 · 1314-23-4

Zirconium Dioxide (ZrO2) Evaporation Materials

Vacuum-degassed 4N (99.99%) Optical Grade (Pure or Y2O3/TiO2-Stabilized) zirconium dioxide (ZrO2, CAS 1314-23-4) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N (99.99%) Optical Grade (Pure or Y2O3/TiO2-Stabilized)
Typical Size1–4 mm sintered granules and tablets
Aluminum Oxide (Sapphire Granules) (Al2O3) Evaporation Materials (Al2O3, CAS 1344-28-1) — Thin Film Materials studio photographTB-EV-AL2O3
Thin Film MaterialsAl2O3 · 1344-28-1

Aluminum Oxide (Sapphire Granules) (Al2O3) Evaporation Materials

Vacuum-degassed 4N5 (99.995%) Crushed Single-Crystal Sapphire & Sintered Tablets aluminum oxide (sapphire granules) (Al2O3, CAS 1344-28-1) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N5 (99.995%) Crushed Single-Crystal Sapphire & Sintered Tablets
Typical Size1–3 mm & 2–5 mm crushed crystal sapphire granules; sintered e-beam tablets
Optical Fluorides (LiF, CaF2, BaF2, YF3, LaF3) (LiF / CaF2 / BaF2 / YF3 / LaF3) Evaporation Materials (LiF / CaF2 / BaF2 / YF3 / LaF3, CAS 7789-75-5) — Thin Film Materials studio photographTB-EV-FL
Thin Film MaterialsLiF / CaF2 / BaF2 / YF3 / LaF3 · 7789-75-5

Optical Fluorides (LiF, CaF2, BaF2, YF3, LaF3) (LiF / CaF2 / BaF2 / YF3 / LaF3) Evaporation Materials

Vacuum-degassed 4N5 (99.995%) Vacuum-Grown Optical Crystal Grade optical fluorides (LiF, CaF2, BaF2, YF3, LaF3) (LiF / CaF2 / BaF2 / YF3 / LaF3, CAS 7789-75-5) evaporation pellets, granules, and slugs engineered for spit-free electron-beam and resistive thermal PVD.

Purity / Grade4N5 (99.995%) Vacuum-Grown Optical Crystal Grade
Typical Size1–3 mm & 2–4 mm crystalline granules (ultra-low moisture)
Silicon Wafers & Thermal Oxide (SiO2/Si) Substrates (Si / SiO2-on-Si, CAS 7440-21-3) — Fused Quartz & Substrates studio photographTB-SUB-SI
Fused Quartz & SubstratesSi / SiO2-on-Si · 7440-21-3

Silicon Wafers & Thermal Oxide (SiO2/Si) Substrates

Epi-ready CMP-polished silicon wafers & thermal oxide (SiO2/Si) substrates (Si / SiO2-on-Si, CAS 7440-21-3) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradePrime / Test CZ & FZ Grade (1–100 Ω·cm, Intrinsic >5,000 Ω·cm, or Degenerate 0.001–0.005 Ω·cm)
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Single-Crystal 4H-SiC & 6H-SiC Wafers & Substrates (SiC (4H / 6H), CAS 409-21-2) — Fused Quartz & Substrates studio photographTB-SUB-SIC
Fused Quartz & SubstratesSiC (4H / 6H) · 409-21-2

Single-Crystal 4H-SiC & 6H-SiC Wafers & Substrates

Epi-ready CMP-polished Single-Crystal 4H-SiC & 6H-SiC wafers & substrates (SiC (4H / 6H), CAS 409-21-2) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradePVT Single-Crystal N-Type Conductive & High-Purity Semi-Insulating (HPSI)
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Strontium Titanate (SrTiO3 & Nb:STO) Single-Crystal Substrates (SrTiO3 / Nb:SrTiO3, CAS 12060-59-2) — Fused Quartz & Substrates studio photographTB-SUB-STO
Fused Quartz & SubstratesSrTiO3 / Nb:SrTiO3 · 12060-59-2

Strontium Titanate (SrTiO3 & Nb:STO) Single-Crystal Substrates

Epi-ready CMP-polished strontium titanate (SrTiO3 & Nb:STO) Single-Crystal substrates (SrTiO3 / Nb:SrTiO3, CAS 12060-59-2) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeVerneuil Single Crystal 4N (Undoped Insulating or 0.05–0.7 wt% Nb-Doped Conductive)
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Yttria-Stabilized Zirconia (YSZ) Single-Crystal Substrates (ZrO2:Y2O3 (8–9.5 mol% Y2O3), CAS 1314-23-4) — Fused Quartz & Substrates studio photographTB-SUB-YSZ
Fused Quartz & SubstratesZrO2:Y2O3 (8–9.5 mol% Y2O3) · 1314-23-4

Yttria-Stabilized Zirconia (YSZ) Single-Crystal Substrates

Epi-ready CMP-polished Yttria-Stabilized zirconia (YSZ) Single-Crystal substrates (ZrO2:Y2O3 (8–9.5 mol% Y2O3), CAS 1314-23-4) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeSkull-Melted Cubic Single Crystal 4N
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Lithium Niobate (LiNbO3) & Lithium Tantalate (LiTaO3) Wafers (LiNbO3 / LiTaO3, CAS 12031-63-9) — Fused Quartz & Substrates studio photographTB-SUB-LNO
Fused Quartz & SubstratesLiNbO3 / LiTaO3 · 12031-63-9

Lithium Niobate (LiNbO3) & Lithium Tantalate (LiTaO3) Wafers

Epi-ready CMP-polished lithium niobate (LiNbO3) & lithium tantalate (LiTaO3) wafers (LiNbO3 / LiTaO3, CAS 12031-63-9) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeCzochralski Optical / SAW / Black-Reduced Grade (Congruent, Stoichiometric, or 5 mol% MgO-Doped)
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
GaN-on-Sapphire & AlN-on-Sapphire Epi Templates (GaN / AlN on α-Al2O3, CAS 25617-97-4) — Fused Quartz & Substrates studio photographTB-SUB-GAN
Fused Quartz & SubstratesGaN / AlN on α-Al2O3 · 25617-97-4

GaN-on-Sapphire & AlN-on-Sapphire Epi Templates

Epi-ready CMP-polished GaN-on-Sapphire & AlN-on-Sapphire epi templates (GaN / AlN on α-Al2O3, CAS 25617-97-4) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeMOCVD / HVPE Epitaxial Template (Undoped, Si-Doped N-Type, or Fe-Doped Semi-Insulating)
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Single-Crystal Quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) Substrates & Windows (α-SiO2 (Single Crystal), CAS 14808-60-7) — Fused Quartz & Substrates studio photographTB-SUB-QZC
Fused Quartz & Substratesα-SiO2 (Single Crystal) · 14808-60-7

Single-Crystal Quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) Substrates & Windows

Epi-ready CMP-polished Single-Crystal quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) substrates & windows (α-SiO2 (Single Crystal), CAS 14808-60-7) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeHydrothermal Cultured Electronic & Optical Grade Single Crystal
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
CaF2, BaF2 & MgF2 UV / Infrared Crystal Windows & Substrates (CaF2 / BaF2 / MgF2, CAS 7789-75-5) — Fused Quartz & Substrates studio photographTB-SUB-CAF2
Fused Quartz & SubstratesCaF2 / BaF2 / MgF2 · 7789-75-5

CaF2, BaF2 & MgF2 UV / Infrared Crystal Windows & Substrates

Epi-ready CMP-polished CaF2, BaF2 & MgF2 UV / infrared crystal windows & substrates (CaF2 / BaF2 / MgF2, CAS 7789-75-5) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeVacuum Bridgman Single-Crystal UV / VUV / IR Excimer Grade
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Borosilicate (Borofloat 33), Alkali-Free Display & FTO/ITO Glass Substrates (SiO2-B2O3-Al2O3 / ITO-Glass / FTO-Glass, CAS 65997-17-3) — Fused Quartz & Substrates studio photographTB-SUB-GLS
Fused Quartz & SubstratesSiO2-B2O3-Al2O3 / ITO-Glass / FTO-Glass · 65997-17-3

Borosilicate (Borofloat 33), Alkali-Free Display & FTO/ITO Glass Substrates

Epi-ready CMP-polished borosilicate (borofloat 33), Alkali-Free display & FTO/ITO glass substrates (SiO2-B2O3-Al2O3 / ITO-Glass / FTO-Glass, CAS 65997-17-3) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeSchott Borofloat 33, Alkali-Free Display Glass, & Pre-Coated ITO/FTO Research Slides
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
High-Purity Tungsten (W) Crucibles & Sapphire Growth Vessels (W, CAS 7440-33-7) — Refractory Metals studio photographTB-W-CRU
Refractory MetalsW · 7440-33-7

High-Purity Tungsten (W) Crucibles & Sapphire Growth Vessels

High-purity 3N5 (99.95%) / 4N (99.99%) CIP-Sintered, Forged, or Spun High-Purity tungsten (w) crucibles & sapphire growth vessels (W, CAS 7440-33-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade3N5 (99.95%) / 4N (99.99%) CIP-Sintered, Forged, or Spun
Typical SizeOD 10–400 mm × Wall 1.5–15 mm (Sintered-machined, forged, or seamless spun)
Pure & Doped Tungsten (W, WL15, WL20, WC20) Rods & Electrodes (W / W-La2O3 / W-CeO2 / W-Y2O3, CAS 7440-33-7) — Refractory Metals studio photographTB-W-ROD
Refractory MetalsW / W-La2O3 / W-CeO2 / W-Y2O3 · 7440-33-7

Pure & Doped Tungsten (W, WL15, WL20, WC20) Rods & Electrodes

High-purity 99.95% Pure W & Non-Radioactive Lanthanated (1.5–2% La2O3) / Ceriated (2% CeO2) pure & doped tungsten (w, WL15, WL20, WC20) rods & electrodes (W / W-La2O3 / W-CeO2 / W-Y2O3, CAS 7440-33-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade99.95% Pure W & Non-Radioactive Lanthanated (1.5–2% La2O3) / Ceriated (2% CeO2)
Typical SizeØ 0.5 mm to Ø 80 mm × Lengths up to 1,000 mm (Centerless Ground h7/h9)
High-Purity Tungsten (W) Foil, Sheet, Plate & Evaporation Ribbon (W, CAS 7440-33-7) — Refractory Metals studio photographTB-W-SH
Refractory MetalsW · 7440-33-7

High-Purity Tungsten (W) Foil, Sheet, Plate & Evaporation Ribbon

High-purity 3N5 (99.95%) / 4N (99.99%) Warm/Cold-Rolled & Stress-Relieved High-Purity tungsten (w) foil, sheet, plate & evaporation ribbon (W, CAS 7440-33-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade3N5 (99.95%) / 4N (99.99%) Warm/Cold-Rolled & Stress-Relieved
Typical SizeFoil 0.025–0.5 mm; Sheet 0.5–3.0 mm; Plate 3.0–25 mm (Alkali-Cleaned or Ground)
Pure & Potassium-Doped Non-Sag Tungsten (W / AKS) Wire & Heater Coils (W / AKS-Doped W / W3Re, CAS 7440-33-7) — Refractory Metals studio photographTB-W-WR
Refractory MetalsW / AKS-Doped W / W3Re · 7440-33-7

Pure & Potassium-Doped Non-Sag Tungsten (W / AKS) Wire & Heater Coils

High-purity 99.95% Pure W, Potassium-Doped Non-Sag (AKS), & W-3%Re Ductile Grade pure & Potassium-Doped Non-Sag tungsten (w / AKS) wire & heater coils (W / AKS-Doped W / W3Re, CAS 7440-33-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade99.95% Pure W, Potassium-Doped Non-Sag (AKS), & W-3%Re Ductile Grade
Typical SizeØ 0.015 mm to Ø 3.0 mm Spools, Straightened Cut Lengths, & Multi-Strand Twisted Coils
Molybdenum & Mo-La (ODS) Crucibles, Sintering Boats & Trays (Mo / Mo-La2O3, CAS 7439-98-7) — Refractory Metals studio photographTB-MO-CRU
Refractory MetalsMo / Mo-La2O3 · 7439-98-7

Molybdenum & Mo-La (ODS) Crucibles, Sintering Boats & Trays

High-purity 99.95% Pure Mo & Lanthanated ODS Mo-La (0.3–0.7 wt% La2O3) molybdenum & Mo-La (ODS) crucibles, sintering boats & trays (Mo / Mo-La2O3, CAS 7439-98-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade99.95% Pure Mo & Lanthanated ODS Mo-La (0.3–0.7 wt% La2O3)
Typical SizeCrucibles OD 10–350 mm; Riveted/Folded/Machined Sintering Boats & Pusher Trays
High-Purity Molybdenum (Mo) Foil, Sheet, Plate & Discs (Mo, CAS 7439-98-7) — Refractory Metals studio photographTB-MO-SH
Refractory MetalsMo · 7439-98-7

High-Purity Molybdenum (Mo) Foil, Sheet, Plate & Discs

High-purity 3N5 (99.95%) / 4N (99.99%) Cross-Rolled & Annealed High-Purity molybdenum (mo) foil, sheet, plate & discs (Mo, CAS 7439-98-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade3N5 (99.95%) / 4N (99.99%) Cross-Rolled & Annealed
Typical SizeFoil 0.025–0.5 mm; Sheet 0.5–3.0 mm; Plate 3.0–40 mm; Stamped/Laser-Cut Discs
Molybdenum (Mo) Rods, Bars, Threaded Studs, Nuts & Washers (Mo, CAS 7439-98-7) — Refractory Metals studio photographTB-MO-ROD
Refractory MetalsMo · 7439-98-7

Molybdenum (Mo) Rods, Bars, Threaded Studs, Nuts & Washers

High-purity 99.95% Pure Molybdenum (ASTM B387 Type 361) molybdenum (mo) rods, bars, threaded studs, nuts & washers (Mo, CAS 7439-98-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade99.95% Pure Molybdenum (ASTM B387 Type 361)
Typical SizeRods Ø 1.0–100 mm; Metric M3–M20 & Imperial Threaded Rods, Hex Nuts, & Screws
TZM Molybdenum Alloy (Mo-0.5Ti-0.08Zr) Plate, Rod & Hot-Zone Tooling (Mo-0.5Ti-0.08Zr-0.02C, CAS 7439-98-7) — Refractory Metals studio photographTB-MO-TZM
Refractory MetalsMo-0.5Ti-0.08Zr-0.02C · 7439-98-7

TZM Molybdenum Alloy (Mo-0.5Ti-0.08Zr) Plate, Rod & Hot-Zone Tooling

High-purity ASTM B387 Type 364 (TZM Precipitation-Hardened Alloy) TZM molybdenum alloy (Mo-0.5Ti-0.08Zr) plate, rod & Hot-Zone tooling (Mo-0.5Ti-0.08Zr-0.02C, CAS 7439-98-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / GradeASTM B387 Type 364 (TZM Precipitation-Hardened Alloy)
Typical SizeRods Ø 3–120 mm; Plate 1–50 mm; Machined Hot-Press Dies, Hearths & Piercing Plugs
High-Purity Tantalum (Ta) Crucibles, Boats & Chemical Liners (Ta, CAS 7440-25-7) — Refractory Metals studio photographTB-TA-CRU
Refractory MetalsTa · 7440-25-7

High-Purity Tantalum (Ta) Crucibles, Boats & Chemical Liners

High-purity 3N5 (99.95%) / 4N (99.99%) Electron-Beam Melted (RO5200 / RO5400) High-Purity tantalum (ta) crucibles, boats & chemical liners (Ta, CAS 7440-25-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade3N5 (99.95%) / 4N (99.99%) Electron-Beam Melted (RO5200 / RO5400)
Typical SizeSeamless Deep-Drawn & Welded Crucibles OD 10–150 mm × Wall 0.5–5.0 mm
High-Purity Tantalum (Ta) Foil, Sheet, Rod, Wire & Capillary Tubing (Ta, CAS 7440-25-7) — Refractory Metals studio photographTB-TA-SH
Refractory MetalsTa · 7440-25-7

High-Purity Tantalum (Ta) Foil, Sheet, Rod, Wire & Capillary Tubing

High-purity 3N5 (99.95%) / 4N (99.99%) Annealed Ductile Grade High-Purity tantalum (ta) foil, sheet, rod, wire & capillary tubing (Ta, CAS 7440-25-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade3N5 (99.95%) / 4N (99.99%) Annealed Ductile Grade
Typical SizeFoil 0.01–0.5 mm; Sheet 0.5–6.0 mm; Wire Ø 0.05–3.0 mm; Rods Ø 2–50 mm; Seamless Tube
High-Purity & Superconducting RRR Niobium (Nb) Foil, Sheet, Rod & Tube (Nb, CAS 7440-03-1) — Refractory Metals studio photographTB-NB-SH
Refractory MetalsNb · 7440-03-1

High-Purity & Superconducting RRR Niobium (Nb) Foil, Sheet, Rod & Tube

High-purity 3N5 (99.95% Type 1/2) & High-RRR 30–300 Superconducting Electron-Beam Grade High-Purity & superconducting RRR niobium (nb) foil, sheet, rod & tube (Nb, CAS 7440-03-1) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade3N5 (99.95% Type 1/2) & High-RRR 30–300 Superconducting Electron-Beam Grade
Typical SizeFoil 0.025–0.5 mm; Sheet 0.5–10 mm; Rod Ø 1–60 mm; Wire Ø 0.1–2.0 mm; Seamless Tube
High-Purity Titanium (4N) & Grade 1 / 2 / 5 (Ti-6Al-4V) Foil, Sheet, Rod & Mesh (Ti / Ti-6Al-4V, CAS 7440-32-6) — Refractory Metals studio photographTB-TI-ML
Refractory MetalsTi / Ti-6Al-4V · 7440-32-6

High-Purity Titanium (4N) & Grade 1 / 2 / 5 (Ti-6Al-4V) Foil, Sheet, Rod & Mesh

High-purity 4N (99.99%) Research Grade, CP Grade 1/2 (ASTM B265/B348), & Grade 5 (Ti-6Al-4V) High-Purity titanium (4N) & grade 1 / 2 / 5 (Ti-6Al-4V) foil, sheet, rod & mesh (Ti / Ti-6Al-4V, CAS 7440-32-6) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade4N (99.99%) Research Grade, CP Grade 1/2 (ASTM B265/B348), & Grade 5 (Ti-6Al-4V)
Typical SizeFoil 0.01–0.5 mm; Sheet 0.5–20 mm; Rod Ø 1–100 mm; Wire Ø 0.1–3 mm; Woven/Expanded Mesh
Zirconium (Zr 702 & Low-Hf 3N5) Crucibles, Foil, Sheet, Rod & Wire (Zr, CAS 7440-67-7) — Refractory Metals studio photographTB-ZR-ML
Refractory MetalsZr · 7440-67-7

Zirconium (Zr 702 & Low-Hf 3N5) Crucibles, Foil, Sheet, Rod & Wire

High-purity ASTM B551 Zr 702 (99.2% Zr+Hf) & Low-Hafnium 3N5 (<100 ppm Hf) Research Grade zirconium (zr 702 & Low-Hf 3N5) crucibles, foil, sheet, rod & wire (Zr, CAS 7440-67-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / GradeASTM B551 Zr 702 (99.2% Zr+Hf) & Low-Hafnium 3N5 (<100 ppm Hf) Research Grade
Typical SizeFusion Crucibles (15–250 mL); Foil 0.025–0.5 mm; Sheet 0.5–10 mm; Rod Ø 2–50 mm
High-Purity Nickel (3N–5N & Ni 200/201) Crucibles, Foil, Sheet, Wire & Mesh (Ni, CAS 7440-02-0) — Refractory Metals studio photographTB-NI-ML
Refractory MetalsNi · 7440-02-0

High-Purity Nickel (3N–5N & Ni 200/201) Crucibles, Foil, Sheet, Wire & Mesh

High-purity 4N (99.99%) / 5N Research Grade & Low-Carbon Nickel 201 (UNS N02201) High-Purity nickel (3N–5N & ni 200/201) crucibles, foil, sheet, wire & mesh (Ni, CAS 7440-02-0) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / Grade4N (99.99%) / 5N Research Grade & Low-Carbon Nickel 201 (UNS N02201)
Typical SizeAlkali-Fusion Crucibles (20–250 mL); Foil 0.01–0.5 mm; Wire Ø 0.05–3 mm; Woven Mesh
Tungsten-Rhenium Thermocouple Wire (Type C, Type D & Type G) & Probes (W5Re / W26Re & W3Re / W25Re, CAS 7440-15-5) — Refractory Metals studio photographTB-WRE-TC
Refractory MetalsW5Re / W26Re & W3Re / W25Re · 7440-15-5

Tungsten-Rhenium Thermocouple Wire (Type C, Type D & Type G) & Probes

High-purity Matched EMF Calibration Grade (ASTM E988 / IEC 60584 Type C & Type D) Tungsten-Rhenium thermocouple wire (type c, type d & type g) & probes (W5Re / W26Re & W3Re / W25Re, CAS 7440-15-5) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / GradeMatched EMF Calibration Grade (ASTM E988 / IEC 60584 Type C & Type D)
Typical SizeMatched Bare Wire Pairs Ø 0.127 mm (0.005"), 0.25 mm (0.010"), 0.38 mm, 0.50 mm + Al2O3/HfO2/BN Insulators
Tungsten-Copper (WCu) & Molybdenum-Copper (MoCu) Thermal Submounts & Electrodes (WCu (90/10, 80/20, 75/25) & MoCu (85/15, 70/30), CAS 7440-33-7) — Refractory Metals studio photographTB-W-CU
Refractory MetalsWCu (90/10, 80/20, 75/25) & MoCu (85/15, 70/30) · 7440-33-7

Tungsten-Copper (WCu) & Molybdenum-Copper (MoCu) Thermal Submounts & Electrodes

High-purity Vacuum Cu-Infiltrated Composite (Zero Open Porosity, Hermetic) Tungsten-Copper (WCu) & Molybdenum-Copper (MoCu) thermal submounts & electrodes (WCu (90/10, 80/20, 75/25) & MoCu (85/15, 70/30), CAS 7440-33-7) engineered for ultra-high-temperature vacuum furnaces, crystal growth, semiconductor processing, and corrosive environments.

Purity / GradeVacuum Cu-Infiltrated Composite (Zero Open Porosity, Hermetic)
Typical SizePlates, Sheets (0.25–25 mm), Rods, & CNC-Machined Ni/Au-Plated RF Flanges
Microporous Alumina & SiC Ceramic Plates, Filters & Wafer Vacuum Chucks (Al2O3 / SiC (Controlled Open Porosity), CAS 1344-28-1) — Technical Ceramics studio photographTB-POR-CK
Technical CeramicsAl2O3 / SiC (Controlled Open Porosity) · 1344-28-1

Microporous Alumina & SiC Ceramic Plates, Filters & Wafer Vacuum Chucks

Precision-planarity microporous alumina and silicon carbide ceramic plates (1–100 µm pore size) for semiconductor wafer vacuum chucks, air bearings, and high-temperature filtration.

Purity / GradeControlled Pore Size 1 µm to 100 µm (30%–48% Open Porosity)
Typical SizeDiscs Ø 25–350 mm, Rectangular Plates, & Bonded Dense-Border Vacuum Chucks
Titanium Diboride (TiB2) Conductive Ceramics & Intermetallic Evaporation Boats (TiB2 / TiB2-BN-AlN, CAS 12045-63-5) — Technical Ceramics studio photographTB-TIB2-CM
Technical CeramicsTiB2 / TiB2-BN-AlN · 12045-63-5

Titanium Diboride (TiB2) Conductive Ceramics & Intermetallic Evaporation Boats

Electrically conductive hot-pressed titanium diboride (TiB2, CAS 12045-63-5) plates and composite TiB2-BN-AlN resistive evaporation boats for continuous aluminum web/batch PVD and molten metal contact.

Purity / GradeHot-Pressed Monolithic TiB2 (≥98% TD) & 2-/3-Component TiB2-BN-AlN Boats
Typical SizeEvaporation Boats (100–150 mm), Plates, Discs, & EDM-Machined Shapes
Semiconductor Fused Quartz Beakers, Wet-Bench Tanks & Vacuum Bell Jars (SiO2 (99.995%), CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-BK
Fused Quartz & SubstratesSiO2 (99.995%) · 60676-86-0

Semiconductor Fused Quartz Beakers, Wet-Bench Tanks & Vacuum Bell Jars

Semiconductor-grade 99.995% clear fused quartz beakers, rectangular wafer wet-bench tanks, and flanged vacuum bell jars with sub-ppm metallic leaching and extreme thermal-shock immunity.

Purity / Grade99.995% Semiconductor & Trace-Metal Analytical Grade
Typical SizeBeakers 25 mL to 5,000 mL; Rectangular RCA Wet-Bench Tanks; Flanged Quartz Bell Jars
UV-VIS-NIR Fused Quartz Spectrophotometer & Fluorometer Cuvettes (190–2,500 nm) (SiO2 (JGS1 / JGS2 / JGS3), CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-CV
Fused Quartz & SubstratesSiO2 (JGS1 / JGS2 / JGS3) · 60676-86-0

UV-VIS-NIR Fused Quartz Spectrophotometer & Fluorometer Cuvettes (190–2,500 nm)

Direct thermally fused (adhesive-free) JGS1 UV-VIS-NIR quartz spectrophotometer and fluorometer cuvettes with >80% transmission from 190 nm to 2,500 nm and matched pair transmission within ≤0.5%.

Purity / GradeJGS1 Synthetic Far-UV Quartz (190–2,500 nm) & JGS3 IR Quartz (260–3,500 nm)
Typical SizePath Lengths: 1 mm, 2 mm, 5 mm, 10 mm, 20 mm, 50 mm, 100 mm (Standard 12.5×12.5×45 mm OD)
Sintered Porous Quartz Fritted Discs, Precision Quartz Rods & Micro-Capillaries (SiO2 (99.99%), CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-FR
Fused Quartz & SubstratesSiO2 (99.99%) · 60676-86-0

Sintered Porous Quartz Fritted Discs, Precision Quartz Rods & Micro-Capillaries

Sintered porous fused quartz fritted discs (porosities G0–G5, 2–250 µm), precision centerless-ground quartz rods, and micro-capillary tubing for plug-flow catalyst reactors and gas sparging.

Purity / Grade99.99% Fused Quartz (Porous Grades G00/G0/G1/G2/G3/G4/G5 & Solid/Capillary)
Typical SizeFrits Ø 4–150 mm × 1.5–6 mm; Solid Rods Ø 1–60 mm; Capillaries ID 0.1–4 mm
CVD SiC-Coated & TaC-Coated Graphite Susceptors, Wafer Carriers & Heaters (C + CVD β-SiC (80–150 µm) / TaC, CAS 409-21-2) — Graphite Components studio photographTB-GR-SIC
Graphite ComponentsC + CVD β-SiC (80–150 µm) / TaC · 409-21-2

CVD SiC-Coated & TaC-Coated Graphite Susceptors, Wafer Carriers & Heaters

CTE-matched purified isostatic graphite susceptors encapsulated in dense 6N CVD β-SiC or tantalum carbide (TaC) coatings for GaN MOCVD, SiC CVD epitaxy, and 2,200 °C PVT crystal growth.

Purity / Grade< 5 ppm Purified Isostatic Graphite + 6N CVD β-SiC or Sintered TaC Coating
Typical Size2", 4", 6", 8" Wafer Pocket Susceptors, Multi-Wafer Planetary Discs, & Custom Heaters
Carbon-Carbon (C/C) Composite Plates, Charging Grids, Channels & Fasteners (C/C (2D / 2.5D Carbon-Fiber Reinforced Carbon), CAS 7440-44-0) — Graphite Components studio photographTB-CFC-PL
Graphite ComponentsC/C (2D / 2.5D Carbon-Fiber Reinforced Carbon) · 7440-44-0

Carbon-Carbon (C/C) Composite Plates, Charging Grids, Channels & Fasteners

High-strength 2D/2.5D carbon-fiber-reinforced carbon (C/C, CFC) composite structural plates, charging grids, hot-press sleeves, and M6–M24 threaded fasteners for vacuum furnaces up to 2,500 °C.

Purity / GradeCVI / Pitch-Densified 2D & 2.5D Carbon-Carbon Composite (<200 ppm or <20 ppm Purified)
Typical SizePlates 1–30 mm, U/L-Profiles, Charging Grids, & M6–M24 C/C Bolts/Nuts/Rods
High-Purity Graphite Crucibles, Stopper Rods & Continuous Casting Dies (C (99.9%–99.999%), CAS 7440-44-0) — Graphite Components studio photographTB-GR-CRU
Graphite ComponentsC (99.9%–99.999%) · 7440-44-0

High-Purity Graphite Crucibles, Stopper Rods & Continuous Casting Dies

Precision-machined high-purity isostatic graphite melting crucibles, clay-free analytical fusion capsules, and continuous casting dies for precious metals, copper alloys, silicon, and crystal growth.

Purity / GradeIsostatic Fine-Grain (<20–50 ppm Ash) & Halogen-Purified (<5 ppm Ash) Grades
Typical SizeCrucibles 5 mL to 50 L; Induction Susceptor Crucibles; Continuous Casting Dies
High-Purity Flexible Graphite Foil, Hot-Press Release Sheets & Vacuum Gaskets (C (99.5% – 99.95% Exfoliated Graphite), CAS 7440-44-0) — Graphite Components studio photographTB-GR-FL
Graphite ComponentsC (99.5% – 99.95% Exfoliated Graphite) · 7440-44-0

High-Purity Flexible Graphite Foil, Hot-Press Release Sheets & Vacuum Gaskets

Binder-free exfoliated flexible graphite foil (0.05–3.0 mm) for Spark Plasma Sintering (SPS) die/punch release liners, high-temperature vacuum gaskets, and anisotropic heat spreaders.

Purity / Grade99.5% Industrial, 99.85% Nuclear (<50 ppm S/Cl), & 99.95% Semiconductor Grade
Typical SizeThickness 0.05 mm, 0.13 mm, 0.25 mm, 0.38 mm, 0.50 mm, 0.80 mm, 1.0 mm, 1.5 mm, 2.0 mm, 3.0 mm
Coin-Cell Hardware Kits (CR2032, CR2025, CR2016), Spacers, Wave Springs & Split Test Cells (316L SS / 304 SS / Al-Clad / Ti, CAS 7439-89-6) — Battery & Milling Labware studio photographTB-BAT-CC
Battery & Milling Labware316L SS / 304 SS / Al-Clad / Ti · 7439-89-6

Coin-Cell Hardware Kits (CR2032, CR2025, CR2016), Spacers, Wave Springs & Split Test Cells

Cleanroom ultrasonic-cleaned 316L and 304 stainless-steel CR2032/CR2025/CR2016 coin-cell cases, PP-gasketed caps, spacer discs, wave springs, and Al-clad high-voltage positive cans.

Purity / GradeElectropolished 316L / 304 Stainless Steel & High-Voltage Al-Clad Positive Cans
Typical SizeCR2032 (Ø20×3.2 mm), CR2025 (Ø20×2.5 mm), CR2016 (Ø20×1.6 mm) + Ø15.8×0.5/1.0 mm Spacers
Battery-Grade Copper Foil (9 µm), Aluminum Foil (15 µm) & Carbon-Coated Current Collectors (Cu (≥99.9%) / Al (≥99.6%) / C-Coated Al & Cu, CAS 7440-50-8) — Battery & Milling Labware studio photographTB-BAT-FL
Battery & Milling LabwareCu (≥99.9%) / Al (≥99.6%) / C-Coated Al & Cu · 7440-50-8

Battery-Grade Copper Foil (9 µm), Aluminum Foil (15 µm) & Carbon-Coated Current Collectors

Electrodeposition and rolled battery-grade copper foil (6–25 µm), aluminum foil (12–25 µm), and 1 µm conductive-carbon-coated Al/Cu current collectors for Li-ion, Na-ion, and supercapacitor doctor-blade coating.

Purity / GradeElectrolytic / Rolled Battery Grade (Cu ≥99.9%, Al 1235/1060 ≥99.6%)
Typical SizeCu Foil 6, 8, 9, 12, 15, 25 µm; Al Foil 12, 15, 16, 20 µm; Widths 150–300 mm & Pre-Punched Discs
Carbon Fiber Paper, Carbon Cloth & MPL-Coated Gas Diffusion Layers (GDL) (C / PTFE (Graphitized PAN Carbon Fiber), CAS 7440-44-0) — Battery & Milling Labware studio photographTB-EC-GDL
Battery & Milling LabwareC / PTFE (Graphitized PAN Carbon Fiber) · 7440-44-0

Carbon Fiber Paper, Carbon Cloth & MPL-Coated Gas Diffusion Layers (GDL)

Graphitized carbon fiber paper, woven carbon cloth, and PTFE/microporous-layer (MPL) coated Gas Diffusion Layers (GDL) for PEM fuel cells, CO2/N2 electroreduction, and redox flow batteries.

Purity / GradeGraphitized >99.5% Carbon (Hydrophilic Untreated, PTFE-Wetproofed, or MPL-Coated)
Typical SizeThickness 110–420 µm; Sheets 200×200 mm, 300×300 mm, 400×400 mm & Rolls
Planetary Ball Mill Jars & Media (Tungsten Carbide, Agate, Alumina, Si3N4, PTFE & 316L SS) (WC-Co / SiO2 (Agate) / Al2O3 / Si3N4 / PTFE / Nylon, CAS 12070-12-1) — Battery & Milling Labware studio photographTB-MIL-WC
Battery & Milling LabwareWC-Co / SiO2 (Agate) / Al2O3 / Si3N4 / PTFE / Nylon · 12070-12-1

Planetary Ball Mill Jars & Media (Tungsten Carbide, Agate, Alumina, Si3N4, PTFE & 316L SS)

Matched planetary ball-mill grinding jars and milling balls in Tungsten Carbide (WC-Co), Natural Brazilian Agate, 99.5% Alumina, Silicon Nitride, PTFE, and 316L Stainless Steel (50 mL to 1,000 mL).

Purity / GradeWC-6%Co, Natural Brazilian Agate (99.9% SiO2), 99.5% Al2O3, Si3N4, Virgin PTFE, & 316L SS
Typical SizeJars: 50 mL, 100 mL, 250 mL, 500 mL, 1,000 mL + Matching Balls (Ø 1–20 mm)
Sourcing & quality workflow

From engineering spec to verified delivery.

Designed for research labs, equipment builders, and procurement teams who need clear documentation without minimum-order friction.

STEP 01

Submit Specification

Select a catalog SKU or custom geometry and specify grade, dimensions, tolerances, quantity, and required COA documents.

STEP 02

Mill & Lot Verification

We verify stock or custom machining lead time with qualified production mills and confirm batch COA parameters.

STEP 03

Written Quote & Checkout

Receive a firm USD quotation with air-express delivery terms and a secure Stripe payment link—no surprises.

STEP 04

Tracked Air Dispatch + COA

Materials ship in protective export packaging via tracked express courier with manufacturer lot COA and dimensional sheets.

Procurement & technical FAQ

Common ordering questions.

Answers for laboratory buyers, procurement engineers, and automated sourcing tools.

What certifications and quality documents ship with Tensile Base materials?
Every shipment includes the producing manufacturer’s batch Certificate of Analysis (COA) detailing chemical purity/trace impurities and key physical metrics (such as bulk density), plus a pre-shipment dimensional check sheet and solid-article safety documentation.
Why does Tensile Base quote per inquiry instead of using fixed shopping-cart prices?
Advanced ceramics, fused quartz, refractory metals, isostatic graphite, and PVD targets vary substantially by purity tier (2N to 5N), dimensional tolerances, bonding/machining configuration, and batch quantity. Written quotations ensure technical fit, accurate factory lead times, and firm landed pricing.
Do you supply small R&D and university prototype quantities as well as production lots?
Yes. Most standard tubes, crucibles, substrates, metal foams, evaporation pellets, QCM crystals, and sputtering targets can be quoted in prototype R&D quantities (1–10 pieces or 50–100 g packs) alongside volume production schedules.
How do payments, lead times, and international air-express shipping work?
Once our sourcing desk confirms exact specifications, lead time (typically 5–15 business days for standard forms or 2–4 weeks for custom CNC parts), and written terms, you receive a secure Stripe Checkout link (card or ACH) or invoice before production/dispatch via tracked DHL, FedEx, or UPS Express.
Can AI procurement agents and engineering tools query the Tensile Base catalog programmatically?
Yes. Full machine-readable catalog specifications, CAS numbers, SKUs, and RFQ schemas are openly published at /llms.txt, /llms-full.txt, /openapi.json, and GET /api/products.
Custom & catalog specifications

Need pricing, lead time, or custom dimensions?

Submit your purity grade, geometry, quantity, and documentation requirements. Every order includes the producing mill's batch Certificate of Analysis (COA) and pre-shipment dimensional verification.

Start a quote request ↗