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Aluminum (Al) Sputtering Targets

Vacuum-melted high-purity aluminum (Al, CAS 7429-90-5) planar magnetron sputtering targets in 4N (99.99%) / 5N (99.999%) / 5N5 grades for semiconductor, optical, and research PVD.

Alternate & search designations: High-purity aluminum PVD magnetron target, 4N (99.99%) / 5N (99.999%) / 5N5 Al planar sputter cathode disc, 5N aluminum sputter target, Al-0.5%Cu / Al-1%Si semiconductor target
Purity / Grade Options4N (99.99%) / 5N (99.999%) / 5N5
Standard DimensionsØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Available ConfigurationsMonolithic or OFHC Cu / Mo backing plate + Metallic Indium / Elastomer bonding
Ordering & MOQSpecification-based quote · Prototype & production lots

Material & Engineering Overview

High-purity aluminum (Al, CAS 7429-90-5) planar sputtering targets are consolidated by vacuum melting or hot isostatic pressing and thermomechanically processed to achieve fine, equiaxed microstructure and ≥99.5%–100% relative density. Controlled grain uniformity and ultra-low dissolved gas content (O, N, H, C) ensure stable DC, pulsed-DC, RF, and HiPIMS plasma impedance with minimal droplet or particle generation across the target erosion track.

High-conductivity vacuum-melted aluminum can be clamped monolithically or bonded for high-rate interconnects and reactive nitride/oxide runs. Each aluminum target is precision-machined to fit 1-inch (25.4 mm), 2-inch (50.8 mm), 3-inch (76.2 mm), 4-inch (100/101.6 mm), or custom rectangular magnetron cathodes, supplied monolithic or indium-bonded to an OFHC copper backing plate, and vacuum-sealed with a batch GDMS or ICP-OES Certificate of Analysis.

Standard Shipment Documentation: Manufacturer Lot COA (GDMS or ICP-OES trace metallic impurity assay in ppm for Al, bulk density), dimensional inspection, and indium-bond check if bonded.

Primary Research & Industrial Applications

  • Semiconductor backend interconnects and bond-pad metallization (Al, Al-Si, Al-Cu)
  • Reactive pulsed-DC / RF sputtering of piezoelectric AlN and dielectric Al2O3
  • High-reflectivity UV/VIS/IR front-surface optical mirrors
  • Display TFT gate/source busline metallization

Nominal Material Reference Properties

Property / MetricNominal Reference Value (Grade Dependent)
Chemical Formula & CAS #Al (CAS 7429-90-5)
Available Purity Tiers4N (99.99%) / 5N (99.999%) / 5N5
Theoretical / Bulk Density2.70 g/cm³
Melting Point660 °C
Thermal / Magnetic NoteNon-magnetic; High thermal conductivity 237 W/m·K

Reference values reflect typical sintered, fused, or wrought grades. Exact batch test figures are confirmed on your written quotation and accompanying lot Certificate of Analysis.

What to Specify in Your Quote Request

Specify aluminum purity grade (4N (99.99%) / 5N (99.999%) / 5N5), target diameter and thickness (e.g., Ø 2.00" × 0.125" or 0.250"), flat edge vs. stepped clamp lip, magnetron gun model, and whether monolithic or indium-bonded to an OFHC copper backing plate is required.

Include target quantity, destination country/postal code for express air freight calculation, and any special cleanroom bagging or certification requests.

Prepare Aluminum (Al) Sputtering Targets RFQ ↗

Technical & Procurement FAQ

What purity grade of aluminum (Al) sputtering target should I select?
Standard 4N (99.99%) purity suits general metallization, hard coatings, and adhesion/barrier layers, while higher 4N5–5N grades are recommended for active semiconductor junctions, low-resistivity interconnects, and quantum/optical research.
Should my aluminum sputtering target be bonded to a copper backing plate?
High-conductivity vacuum-melted aluminum can be clamped monolithically or bonded for high-rate interconnects and reactive nitride/oxide runs. Bonding with metallic indium to an OFHC copper backing plate is recommended for brittle compositions, thin discs, or high-power-density runs (keep cooling water at 18–22 °C so the indium bond stays below 120 °C).
What batch certification ships with TB-PVD-AL?
Every aluminum target ships vacuum-sealed in an argon/moisture barrier bag accompanied by the producing mill's lot Certificate of Analysis reporting elemental purity and trace metallic impurities in ppm.
Cross-referenced catalog

Related technical materials.

Complementary furnaceware, substrates, PVD consumables, and refractory hardware frequently ordered together.

Metal Sputtering Targets (Ti / Cr / Al / Cu / Ni / W / Mo / Ta, CAS 7440-32-6) — Thin Film Materials studio photographTB-PVD-MT
Thin Film MaterialsTi / Cr / Al / Cu / Ni / W / Mo / Ta · 7440-32-6

Metal Sputtering Targets

Vacuum-melted and thermomechanically forged pure metal and custom alloy planar sputtering targets (3N5–5N) sized for research and production magnetron cathodes.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5 / 5N (99.999%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 1–12.7 mm; Rectangular plates
Custom & catalog specifications

Need pricing, lead time, or custom dimensions?

Submit your purity grade, geometry, quantity, and documentation requirements. Every order includes the producing mill's batch Certificate of Analysis (COA) and pre-shipment dimensional verification.

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