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Fused Quartz & Substrates · TB-SUB-LNO

Lithium Niobate (LiNbO3) & Lithium Tantalate (LiTaO3) Wafers

Epi-ready CMP-polished lithium niobate (LiNbO3) & lithium tantalate (LiTaO3) wafers (LiNbO3 / LiTaO3, CAS 12031-63-9) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Alternate & search designations: Epi-ready LiNbO3 / LiTaO3 single crystal wafer, lithium niobate (LiNbO3) & lithium tantalate (LiTaO3) wafers thin-film growth substrate, X-Cut, Y-Cut, Z-Cut, 128° Y-X Cut, 36°/42°/64° Y-X Cut LiNbO3 / LiTaO3
Purity / Grade OptionsCzochralski Optical / SAW / Black-Reduced Grade (Congruent, Stoichiometric, or 5 mol% MgO-Doped)
Standard Dimensions10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Available Configurations1-Side (SSP) or 2-Side (DSP) Epi-Ready CMP Polish; Cleanroom 100 Pack
Ordering & MOQSpecification-based quote · Prototype & production lots

Material & Engineering Overview

Precision-grown and chemical-mechanical-polished (CMP) in a Class 100 cleanroom, our lithium niobate (LiNbO3) & lithium tantalate (LiTaO3) wafers (LiNbO3 / LiTaO3, CAS 12031-63-9) substrates provide atomically smooth, epi-ready surfaces (Ra < 0.2–0.5 nm) for thin-film epitaxy, pulsed laser deposition (PLD), magnetron sputtering, molecular beam epitaxy (MBE), and optical characterization.

High electro-optic (Pockels), nonlinear optical, and piezoelectric coupling coefficients make LiNbO3 and LiTaO3 wafers indispensable for RF SAW/BAW filters, integrated photonic modulators, and acoustic transducer research. Standard research sizes include 5×5 mm, 10×10 mm, and 15×15 mm diced squares (0.5 mm or 1.0 mm thick) as well as Ø 1-inch, 2-inch, 3-inch, and 4-inch wafers in single-side (SSP) or double-side (DSP) polished finishes, packed in individual waffle trays or nitrogen-sealed cassettes with batch orientation and surface inspection data.

Standard Shipment Documentation: Manufacturer Lot COA (crystal orientation X-ray verification, surface roughness Ra, thickness tolerance, and resistivity/doping if applicable).

Primary Research & Industrial Applications

  • Surface acoustic wave (SAW) RF filters and delay lines (128° Y-X LiNbO3, 36°/42° Y-X LiTaO3)
  • Thin-film lithium niobate (TFLN) electro-optic modulators and PPLN frequency doublers
  • Piezoelectric ultrasonic transducers and acousto-optic deflectors
  • Pyroelectric infrared sensors and domain-engineering research

Nominal Material Reference Properties

Property / MetricNominal Reference Value (Grade Dependent)
Formula & CAS #LiNbO3 / LiTaO3 (CAS 12031-63-9)
Crystal System / GradeTrigonal (R3c) · Czochralski Optical / SAW / Black-Reduced Grade (Congruent, Stoichiometric, or 5 mol% MgO-Doped)
Density4.65 (LiNbO3) / 7.45 (LiTaO3) g/cm³
Standard OrientationsX-Cut, Y-Cut, Z-Cut, 128° Y-X Cut, 36°/42°/64° Y-X Cut
Surface Finish (CMP)Ra < 0.3 nm Optical & SAW Grade SSP/DSP

Reference values reflect typical sintered, fused, or wrought grades. Exact batch test figures are confirmed on your written quotation and accompanying lot Certificate of Analysis.

What to Specify in Your Quote Request

Specify LiNbO3 / LiTaO3 crystallographic orientation (X-Cut, Y-Cut, Z-Cut, 128° Y-X Cut, 36°/42°/64° Y-X Cut), dimensions and thickness (e.g., 10×10×0.5 mm or Ø 2" × 0.5 mm), SSP vs. DSP polish, edge orientation, and pack count.

Include target quantity, destination country/postal code for express air freight calculation, and any special cleanroom bagging or certification requests.

Prepare Lithium Niobate (LiNbO3) & Lithium Tantalate (LiTaO3) Wafers RFQ ↗

Technical & Procurement FAQ

Are lithium niobate (LiNbO3) & lithium tantalate (LiTaO3) wafers (LiNbO3 / LiTaO3) substrates ready for epitaxial deposition out of the box?
Yes. All epi-ready substrates are final CMP-polished and packaged in cleanroom waffle packs or sealed containers with sub-nanometer Ra roughness.
What tolerances apply to 10×10×0.5 mm diced LiNbO3 / LiTaO3 substrates?
Standard lateral dimensions are ±0.05–0.10 mm, thickness is ±0.02–0.05 mm, and crystal axis orientation accuracy is within ±0.5° (or ±0.1° on custom request).
Can I order custom sizes, thicknesses, or double-side polishing for TB-SUB-LNO?
Yes. Both single-side (SSP) and double-side (DSP) polished substrates as well as custom laser/wire-saw diced dimensions can be quoted with no high minimum order quantity.
Cross-referenced catalog

Related technical materials.

Complementary furnaceware, substrates, PVD consumables, and refractory hardware frequently ordered together.

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Purity / Grade≥99.995% Single-Crystal Al2O3 (4N5–5N Kyropoulos/EFG)
Typical SizeChips 5×5, 10×10 mm; Windows Ø 5–100 mm; Wafers 2", 4", 6"
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Single-Crystal Quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) Substrates & Windows

Epi-ready CMP-polished Single-Crystal quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) substrates & windows (α-SiO2 (Single Crystal), CAS 14808-60-7) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

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Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
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Thin Film MaterialsAl1-xScx (Sc 5–43 at.%) · 60683-64-9

Aluminum-Scandium (AlSc Alloy) (Al1-xScx (Sc 5–43 at.%)) Sputtering Targets

Vacuum-melted high-purity Aluminum-Scandium (AlSc alloy) (Al1-xScx (Sc 5–43 at.%), CAS 60683-64-9) planar magnetron sputtering targets in 4N (99.99%) Vacuum-Melted / HIP Intermetallic grades for semiconductor, optical, and research PVD.

Purity / Grade4N (99.99%) Vacuum-Melted / HIP Intermetallic
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 2–12.7 mm; Rectangular
Custom & catalog specifications

Need pricing, lead time, or custom dimensions?

Submit your purity grade, geometry, quantity, and documentation requirements. Every order includes the producing mill's batch Certificate of Analysis (COA) and pre-shipment dimensional verification.

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