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Fused Quartz & Substrates · TB-SUB-QZC

Single-Crystal Quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) Substrates & Windows

Epi-ready CMP-polished Single-Crystal quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) substrates & windows (α-SiO2 (Single Crystal), CAS 14808-60-7) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Alternate & search designations: Epi-ready α-SiO2 (Single Crystal) single crystal wafer, Single-Crystal quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) substrates & windows thin-film growth substrate, Z-Cut (0001), X-Cut, Y-Cut, AT-Cut (35°15'), ST-Cut (42°45') α-SiO2 (Single Crystal)
Purity / Grade OptionsHydrothermal Cultured Electronic & Optical Grade Single Crystal
Standard Dimensions10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
Available Configurations1-Side (SSP) or 2-Side (DSP) Epi-Ready CMP Polish; Cleanroom 100 Pack
Ordering & MOQSpecification-based quote · Prototype & production lots

Material & Engineering Overview

Precision-grown and chemical-mechanical-polished (CMP) in a Class 100 cleanroom, our Single-Crystal quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) substrates & windows (α-SiO2 (Single Crystal), CAS 14808-60-7) substrates provide atomically smooth, epi-ready surfaces (Ra < 0.2–0.5 nm) for thin-film epitaxy, pulsed laser deposition (PLD), magnetron sputtering, molecular beam epitaxy (MBE), and optical characterization.

Unlike amorphous fused silica, hydrothermal single-crystal α-quartz exhibits piezoelectricity, optical birefringence, and high crystalline thermal conductivity along the Z-axis (~10–12 W/m·K at RT, rising sharply at cryogenic temperatures). Standard research sizes include 5×5 mm, 10×10 mm, and 15×15 mm diced squares (0.5 mm or 1.0 mm thick) as well as Ø 1-inch, 2-inch, 3-inch, and 4-inch wafers in single-side (SSP) or double-side (DSP) polished finishes, packed in individual waffle trays or nitrogen-sealed cassettes with batch orientation and surface inspection data.

Standard Shipment Documentation: Manufacturer Lot COA (crystal orientation X-ray verification, surface roughness Ra, thickness tolerance, and resistivity/doping if applicable).

Primary Research & Industrial Applications

  • Temperature-compensated ST-cut and AT-cut SAW/BAW piezoelectric resonators and delay lines
  • Zero-order and multi-order optical waveplates and polarization optics
  • Cryogenic THz optics and low-loss high-thermal-conductivity quantum substrates
  • Epitaxial 2D material and oxide growth on crystalline SiO2

Nominal Material Reference Properties

Property / MetricNominal Reference Value (Grade Dependent)
Formula & CAS #α-SiO2 (Single Crystal) (CAS 14808-60-7)
Crystal System / GradeTrigonal (α-Quartz, P3₁21) · Hydrothermal Cultured Electronic & Optical Grade Single Crystal
Density2.65 g/cm³
Standard OrientationsZ-Cut (0001), X-Cut, Y-Cut, AT-Cut (35°15'), ST-Cut (42°45')
Surface Finish (CMP)Ra < 0.3 nm Double-Side Optical & SAW Polish

Reference values reflect typical sintered, fused, or wrought grades. Exact batch test figures are confirmed on your written quotation and accompanying lot Certificate of Analysis.

What to Specify in Your Quote Request

Specify α-SiO2 (Single Crystal) crystallographic orientation (Z-Cut (0001), X-Cut, Y-Cut, AT-Cut (35°15'), ST-Cut (42°45')), dimensions and thickness (e.g., 10×10×0.5 mm or Ø 2" × 0.5 mm), SSP vs. DSP polish, edge orientation, and pack count.

Include target quantity, destination country/postal code for express air freight calculation, and any special cleanroom bagging or certification requests.

Prepare Single-Crystal Quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) Substrates & Windows RFQ ↗

Technical & Procurement FAQ

Are Single-Crystal quartz (AT-Cut, ST-Cut, X/Y/Z-Cut) substrates & windows (α-SiO2 (Single Crystal)) substrates ready for epitaxial deposition out of the box?
Yes. All epi-ready substrates are final CMP-polished and packaged in cleanroom waffle packs or sealed containers with sub-nanometer Ra roughness.
What tolerances apply to 10×10×0.5 mm diced α-SiO2 (Single Crystal) substrates?
Standard lateral dimensions are ±0.05–0.10 mm, thickness is ±0.02–0.05 mm, and crystal axis orientation accuracy is within ±0.5° (or ±0.1° on custom request).
Can I order custom sizes, thicknesses, or double-side polishing for TB-SUB-QZC?
Yes. Both single-side (SSP) and double-side (DSP) polished substrates as well as custom laser/wire-saw diced dimensions can be quoted with no high minimum order quantity.
Cross-referenced catalog

Related technical materials.

Complementary furnaceware, substrates, PVD consumables, and refractory hardware frequently ordered together.

QCM Thin-Film Deposition Monitor Crystals (α-SiO2 + Au / Ag-Al Alloy Electrodes, CAS 14808-60-7) — Thin Film Materials studio photographTB-PVD-QCM
Thin Film Materialsα-SiO2 + Au / Ag-Al Alloy Electrodes · 14808-60-7

QCM Thin-Film Deposition Monitor Crystals

Precision 6.0 MHz and 5.0 MHz AT-cut plano-convex quartz crystal microbalance (QCM) thickness monitor sensors with gold or stress-relieving alloy electrodes in cleanroom dispenser packs.

Purity / GradeAT-Cut Piezoelectric Quartz (6.0 MHz & 5.0 MHz Fundamental)
Typical SizeØ 13.97 mm (0.550") Plano-Convex Standard Sensor Discs
UV Fused Silica & Optical Quartz Windows (SiO2, CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-WN
Fused Quartz & SubstratesSiO2 · 60676-86-0

UV Fused Silica & Optical Quartz Windows

Precision double-side optically polished UV synthetic fused silica (JGS1), optical quartz (JGS2), and full-spectrum IR fused silica (JGS3) windows and wafer substrates.

Purity / GradeJGS1 (Deep-UV 185–2,100 nm) / JGS2 (UV-VIS) / JGS3 (IR Low-OH)
Typical SizeØ 5–200 mm or Square 5×5 to 150×150 mm × Thickness 0.2–20 mm
Lithium Niobate (LiNbO3) & Lithium Tantalate (LiTaO3) Wafers (LiNbO3 / LiTaO3, CAS 12031-63-9) — Fused Quartz & Substrates studio photographTB-SUB-LNO
Fused Quartz & SubstratesLiNbO3 / LiTaO3 · 12031-63-9

Lithium Niobate (LiNbO3) & Lithium Tantalate (LiTaO3) Wafers

Epi-ready CMP-polished lithium niobate (LiNbO3) & lithium tantalate (LiTaO3) wafers (LiNbO3 / LiTaO3, CAS 12031-63-9) wafers and diced research squares with sub-nanometer surface roughness for PVD, PLD, MBE, and ALD.

Purity / GradeCzochralski Optical / SAW / Black-Reduced Grade (Congruent, Stoichiometric, or 5 mol% MgO-Doped)
Typical Size10×10 mm, 5×5 mm, 10×5 mm, Ø 1", Ø 2", Ø 3", Ø 4" × 0.5 mm / 1.0 mm
High-Purity Fused Quartz Furnace Tubes (SiO2, CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-TU
Fused Quartz & SubstratesSiO2 · 60676-86-0

High-Purity Fused Quartz Furnace Tubes

Optically clear 99.99% (4N) fused quartz process tubes for CVD graphene/2D growth, semiconductor diffusion, photochemistry, and rapid-quench tube furnaces up to 1,150 °C.

Purity / Grade≥99.99% SiO2 (4N Semiconductor Grade, <20 ppm total metals)
Typical SizeOD 6–300 mm × Wall 1.5–8 mm × Length up to 2,000 mm
Custom & catalog specifications

Need pricing, lead time, or custom dimensions?

Submit your purity grade, geometry, quantity, and documentation requirements. Every order includes the producing mill's batch Certificate of Analysis (COA) and pre-shipment dimensional verification.

Start a quote request ↗