Thin Film Materials · TB-PVD-TMD
2D Transition-Metal Dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2) Sputtering Targets
High-density hot-pressed 2D Transition-Metal dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2, CAS 1317-33-5) ceramic sputtering targets in 4N (99.99%) purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.
Alternate & search designations: 2D Transition-Metal Dichalcogenides (MoS2, WS2, MoSe2, WSe2) RF magnetron target, MoS2 / WS2 / MoSe2 / WSe2 PVD dielectric cathode disc, 4N MoS2, WS2, MoSe2, & WSe2 2D TMD sputtering targets
Purity / Grade Options4N (99.99%)
Standard DimensionsØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Available ConfigurationsHot-pressed / HIP high-density ceramic disc; Metallic Indium bonded to OFHC Cu
Ordering & MOQSpecification-based quote · Prototype & production lots
Material & Engineering Overview
Sintered by vacuum hot-pressing or Hot Isostatic Pressing (HIP) from sub-micron 4N (99.99%) precursor powders, our 2D Transition-Metal dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2, CAS 1317-33-5) sputtering targets achieve high relative density (typically 96%–99.5% of 4.95–7.40 g/cm³ theoretical density) and homogeneous phase stoichiometry. High density suppresses outgassing, surface nodule formation, and plasma arcing during RF magnetron or reactive pulsed-DC sputtering.
Hot-pressed high-density chalcogenide targets allow wafer-scale magnetron sputtering of 2D semiconductor layers and ultra-low-friction vacuum solid-lubricant coatings. Because ceramic targets have low thermal conductivity and limited thermal-shock resistance, we strongly recommend ordering MoS2 / WS2 / MoSe2 / WSe2 targets metallic-indium bonded to an OFHC copper backing plate. Each target ships vacuum-packed with its batch chemical assay and density COA.
Standard Shipment Documentation: Manufacturer Lot COA (stoichiometry, trace metal ICP assay in ppm, sintered bulk density) and backing-plate bond inspection.
Primary Research & Industrial Applications
- Wafer-scale 2D semiconductor channels (MoS2, WS2, MoSe2, WSe2) for FETs and photodetectors
- Aerospace & vacuum-mechanism ultra-low-friction solid lubricant coatings (MoS2 / WS2)
- Hydrogen evolution reaction (HER) electrocatalyst thin films
- Van der Waals heterojunction optoelectronics
Nominal Material Reference Properties
| Property / Metric | Nominal Reference Value (Grade Dependent) |
| Formula & CAS # | MoS2 / WS2 / MoSe2 / WSe2 (CAS 1317-33-5) |
| Purity Grades | 4N (99.99%) |
| Bulk / Theoretical Density | 4.95–7.40 g/cm³ (≥96%–99.5% relative density) |
| Recommended Bonding | Metallic Indium bond to OFHC Cu backing plate (<120 °C max run temp) |
| Recommended Power Ramp | RF / Pulsed-DC ramp at 5–10 W/min with ≥2–4 L/min cooling water |
Reference values reflect typical sintered, fused, or wrought grades. Exact batch test figures are confirmed on your written quotation and accompanying lot Certificate of Analysis.
What to Specify in Your Quote Request
Specify MoS2 / WS2 / MoSe2 / WSe2 purity (4N (99.99%)), exact dopant weight/mole ratio if applicable, ceramic disc diameter × thickness (e.g., Ø 50.8 × 3.175 mm), backing-plate geometry, and sputtering chamber gun model.
Include target quantity, destination country/postal code for express air freight calculation, and any special cleanroom bagging or certification requests.
Prepare 2D Transition-Metal Dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2) Sputtering Targets RFQ ↗
Technical & Procurement FAQ
Why should 2D Transition-Metal dichalcogenides (MoS2, WS2, MoSe2, WSe2) (MoS2 / WS2 / MoSe2 / WSe2) targets be indium-bonded to an OFHC copper backing plate?
As a brittle ceramic, MoS2 / WS2 / MoSe2 / WSe2 develops steep radial thermal gradients under RF plasma heating; full-coverage metallic indium bonding transfers heat efficiently into the water-cooled copper backing plate and prevents thermal-stress cracking.
What RF power conditioning procedure avoids cracking a new MoS2 / WS2 / MoSe2 / WSe2 target?
Start at low RF power (~15–25 W on a 2-inch target), ramp slowly at 5–10 W/min over 20–30 minutes while monitoring reflected power, and never exceed ~2–4 W/cm² power density on dielectric oxide/nitride targets.
Is oxygen or nitrogen reactive gas backfill needed when sputtering MoS2 / WS2 / MoSe2 / WSe2?
RF sputtering in pure argon often produces slightly anion-deficient films; introducing 1%–10% O2 (for oxides) or N2 (for nitrides) in the Ar plasma restores full stoichiometry and optical transparency.