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Thin Film Materials · TB-PVD-OX

Oxide & Nitride Ceramic Sputtering Targets

High-density hot-pressed and HIP-consolidated oxide, nitride, carbide, and sulfide ceramic sputtering targets (ITO, AZO, ZnO, Al2O3, SiO2, TiO2, BaTiO3) indium-bonded for arc-free RF/pulsed-DC PVD.

Alternate & search designations: ITO 90/10 In2O3:SnO2 TCO target, AZO Al-doped ZnO target, RF dielectric Al2O3/SiO2/TiO2/HfO2 sputter target, LTO/LLZO thin-film battery target
Purity / Grade Options99.9% (3N) / 99.99% (4N) / 99.995% (4N5)
Standard DimensionsØ 1", 2", 3", 4", 6" × Thickness 2–6 mm (+ Cu Backing Plate)
Available ConfigurationsHot-pressed / HIP / oxygen-sintered high-density discs; Indium bonded
Ordering & MOQSpecification-based quote · Prototype & production lots

Material & Engineering Overview

Dielectric and transparent-conducting-oxide (TCO) ceramic sputtering targets require high sintered relative density (≥98%–99.5% for ITO/ZnO) and uniform stoichiometry to suppress nodule growth, micro-arcing, and thermal cracking under RF or pulsed-DC magnetron plasma. Because ceramics have low thermal shock tolerance, bonding to an OFHC copper backing plate with pure metallic indium is strongly recommended for reliable heat extraction.

Standard compositions include ITO (In2O3:SnO2 90:10 wt%), AZO (ZnO:Al2O3 98:2 wt%), IGZO, ZnO, Al2O3, SiO2, TiO2, Ta2O5, Nb2O5, HfO2, ZrO2/YSZ, BaTiO3, LiCoO2/Li3PO4 battery oxides, AlN, Si3N4, TiN, and SiC.

Standard Shipment Documentation: Manufacturer Lot COA (composition stoichiometry, trace metal ICP assay, sintered density) and backing-plate bond inspection.

Primary Research & Industrial Applications

  • Transparent conductive electrodes (ITO, AZO, IZO) for photovoltaics, displays, and sensors
  • Optical anti-reflection, high-index/low-index dielectric mirrors, and waveguide coatings (SiO2, TiO2, Ta2O5, HfO2)
  • Gate dielectrics, piezoelectric MEMS (AlN, ZnO, PZT), and ferroelectrics
  • Solid-state thin-film microbattery cathode & LiPON/LLZO electrolyte deposition

Nominal Material Reference Properties

Property / MetricNominal Reference Value (Grade Dependent)
Purity99.9% (3N) to 99.995% (4N5)
Relative Sintered Density≥99.5% (ITO) / 95%–99% (oxides & nitrides by HIP/hot-pressing)
Recommended BondingMetallic Indium bond to OFHC Cu backing plate (max target temp <150 °C)
RF Power RampGradual RF power conditioning (5–10 W/min) recommended
Standard Thicknesses3.0 mm, 3.175 mm (1/8"), 5.0 mm, 6.35 mm (1/4")

Reference values reflect typical sintered, fused, or wrought grades. Exact batch test figures are confirmed on your written quotation and accompanying lot Certificate of Analysis.

What to Specify in Your Quote Request

Specify exact chemical formula and weight/mole dopant ratio (e.g., In2O3:SnO2 90:10 wt%), purity, target diameter × ceramic thickness, backing plate total thickness/step geometry (or gun model), and indium vs. elastomer bond.

Include target quantity, destination country/postal code for express air freight calculation, and any special cleanroom bagging or certification requests.

Prepare Oxide & Nitride Ceramic Sputtering Targets RFQ ↗

Technical & Procurement FAQ

Why should ceramic sputtering targets almost always be indium-bonded to a copper backing plate?
Ceramic targets have poor thermal conductivity and tensile strength; local plasma heating without full-face metallic indium thermal contact to a water-cooled copper backing plate will crack an unbonded ceramic disc even at modest RF wattages.
What is the maximum operating temperature of an indium-bonded target?
Pure indium melts at 156.6 °C—always verify cooling water flow (typically ≥2–4 L/min at 18–22 °C) before striking plasma and ramp RF power gradually so bondline temperature stays safely below 120 °C.
Can custom multi-cation perovskite or solid-state battery oxide targets be synthesized to stoichiometry?
Yes—custom mixed-oxide and lithium-excess stoichiometric targets (e.g., 10–15 mol% Li excess to compensate PVD lithium loss) are hot-pressed to customer formula.
Cross-referenced catalog

Related technical materials.

Complementary furnaceware, substrates, PVD consumables, and refractory hardware frequently ordered together.

Metal Sputtering Targets (Ti / Cr / Al / Cu / Ni / W / Mo / Ta, CAS 7440-32-6) — Thin Film Materials studio photographTB-PVD-MT
Thin Film MaterialsTi / Cr / Al / Cu / Ni / W / Mo / Ta · 7440-32-6

Metal Sputtering Targets

Vacuum-melted and thermomechanically forged pure metal and custom alloy planar sputtering targets (3N5–5N) sized for research and production magnetron cathodes.

Purity / Grade3N5 (99.95%) / 4N (99.99%) / 4N5 / 5N (99.999%)
Typical SizeØ 1", 2", 3", 4", 6", 8" × Thickness 1–12.7 mm; Rectangular plates
UV Fused Silica & Optical Quartz Windows (SiO2, CAS 60676-86-0) — Fused Quartz & Substrates studio photographTB-SIO2-WN
Fused Quartz & SubstratesSiO2 · 60676-86-0

UV Fused Silica & Optical Quartz Windows

Precision double-side optically polished UV synthetic fused silica (JGS1), optical quartz (JGS2), and full-spectrum IR fused silica (JGS3) windows and wafer substrates.

Purity / GradeJGS1 (Deep-UV 185–2,100 nm) / JGS2 (UV-VIS) / JGS3 (IR Low-OH)
Typical SizeØ 5–200 mm or Square 5×5 to 150×150 mm × Thickness 0.2–20 mm
Single-Crystal Sapphire Windows & Substrates (α-Al2O3 (Single Crystal), CAS 1344-28-1) — Fused Quartz & Substrates studio photographTB-SAP-SB
Fused Quartz & Substratesα-Al2O3 (Single Crystal) · 1344-28-1

Single-Crystal Sapphire Windows & Substrates

Epi-ready single-crystal sapphire substrates (C-, R-, A-, M-plane) and Mohs-9 optical sapphire pressure/IR windows from 180 nm UV to 5.0 µm mid-IR.

Purity / Grade≥99.995% Single-Crystal Al2O3 (4N5–5N Kyropoulos/EFG)
Typical SizeChips 5×5, 10×10 mm; Windows Ø 5–100 mm; Wafers 2", 4", 6"
QCM Thin-Film Deposition Monitor Crystals (α-SiO2 + Au / Ag-Al Alloy Electrodes, CAS 14808-60-7) — Thin Film Materials studio photographTB-PVD-QCM
Thin Film Materialsα-SiO2 + Au / Ag-Al Alloy Electrodes · 14808-60-7

QCM Thin-Film Deposition Monitor Crystals

Precision 6.0 MHz and 5.0 MHz AT-cut plano-convex quartz crystal microbalance (QCM) thickness monitor sensors with gold or stress-relieving alloy electrodes in cleanroom dispenser packs.

Purity / GradeAT-Cut Piezoelectric Quartz (6.0 MHz & 5.0 MHz Fundamental)
Typical SizeØ 13.97 mm (0.550") Plano-Convex Standard Sensor Discs
Custom & catalog specifications

Need pricing, lead time, or custom dimensions?

Submit your purity grade, geometry, quantity, and documentation requirements. Every order includes the producing mill's batch Certificate of Analysis (COA) and pre-shipment dimensional verification.

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