Thin Film Materials · TB-PVD-ITO
Indium Tin Oxide (In2O3:SnO2 (90:10 wt%)) Sputtering Targets
High-density hot-pressed indium tin oxide (In2O3:SnO2 (90:10 wt%), CAS 50926-11-9) ceramic sputtering targets in 4N (99.99%) · ≥99.5% Relative Density purity, indium-bonded for arc-free RF and pulsed-DC thin-film deposition.
Alternate & search designations: Indium Tin Oxide RF magnetron target, In2O3:SnO2 (90:10 wt%) PVD dielectric cathode disc, 90/10 In2O3:SnO2 TCO sputter target, high-density black/blue ITO cathode
Purity / Grade Options4N (99.99%) · ≥99.5% Relative Density
Standard DimensionsØ 1", 2", 3", 4", 6" × Thickness 2–6.35 mm (+ OFHC Cu Backing Plate)
Available ConfigurationsHot-pressed / HIP high-density ceramic disc; Metallic Indium bonded to OFHC Cu
Ordering & MOQSpecification-based quote · Prototype & production lots
Material & Engineering Overview
Sintered by vacuum hot-pressing or Hot Isostatic Pressing (HIP) from sub-micron 4N (99.99%) · ≥99.5% Relative Density precursor powders, our indium tin oxide (In2O3:SnO2 (90:10 wt%), CAS 50926-11-9) sputtering targets achieve high relative density (typically 96%–99.5% of 7.12 g/cm³ theoretical density) and homogeneous phase stoichiometry. High density suppresses outgassing, surface nodule formation, and plasma arcing during RF magnetron or reactive pulsed-DC sputtering.
Oxygen-sintered to ≥99.5% theoretical density with low bulk resistivity (<1.5 × 10⁻⁴ Ω·cm), our 90:10 wt% ITO targets support both DC and RF magnetron sputtering with minimal black nodule build-up. Because ceramic targets have low thermal conductivity and limited thermal-shock resistance, we strongly recommend ordering In2O3:SnO2 (90:10 wt%) targets metallic-indium bonded to an OFHC copper backing plate. Each target ships vacuum-packed with its batch chemical assay and density COA.
Standard Shipment Documentation: Manufacturer Lot COA (stoichiometry, trace metal ICP assay in ppm, sintered bulk density) and backing-plate bond inspection.
Primary Research & Industrial Applications
- Transparent conductive electrodes (TCO) for OLED, LCD, touch panels, and electrochromics
- Perovskite, silicon heterojunction (SHJ), and organic solar cell front windows
- EMI/RFI optical shielding viewports and heated anti-fog aerospace windows
- Infrared-reflective Low-E coatings and optoelectronic sensors
Nominal Material Reference Properties
| Property / Metric | Nominal Reference Value (Grade Dependent) |
| Formula & CAS # | In2O3:SnO2 (90:10 wt%) (CAS 50926-11-9) |
| Purity Grades | 4N (99.99%) · ≥99.5% Relative Density |
| Bulk / Theoretical Density | 7.12 g/cm³ (≥96%–99.5% relative density) |
| Recommended Bonding | Metallic Indium bond to OFHC Cu backing plate (<120 °C max run temp) |
| Recommended Power Ramp | RF / Pulsed-DC ramp at 5–10 W/min with ≥2–4 L/min cooling water |
Reference values reflect typical sintered, fused, or wrought grades. Exact batch test figures are confirmed on your written quotation and accompanying lot Certificate of Analysis.
What to Specify in Your Quote Request
Specify In2O3:SnO2 (90:10 wt%) purity (4N (99.99%) · ≥99.5% Relative Density), exact dopant weight/mole ratio if applicable, ceramic disc diameter × thickness (e.g., Ø 50.8 × 3.175 mm), backing-plate geometry, and sputtering chamber gun model.
Include target quantity, destination country/postal code for express air freight calculation, and any special cleanroom bagging or certification requests.
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Technical & Procurement FAQ
Why should indium tin oxide (In2O3:SnO2 (90:10 wt%)) targets be indium-bonded to an OFHC copper backing plate?
As a brittle ceramic, In2O3:SnO2 (90:10 wt%) develops steep radial thermal gradients under RF plasma heating; full-coverage metallic indium bonding transfers heat efficiently into the water-cooled copper backing plate and prevents thermal-stress cracking.
What RF power conditioning procedure avoids cracking a new In2O3:SnO2 (90:10 wt%) target?
Start at low RF power (~15–25 W on a 2-inch target), ramp slowly at 5–10 W/min over 20–30 minutes while monitoring reflected power, and never exceed ~2–4 W/cm² power density on dielectric oxide/nitride targets.
Is oxygen or nitrogen reactive gas backfill needed when sputtering In2O3:SnO2 (90:10 wt%)?
RF sputtering in pure argon often produces slightly anion-deficient films; introducing 1%–10% O2 (for oxides) or N2 (for nitrides) in the Ar plasma restores full stoichiometry and optical transparency.